Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress

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概要

• 論文の詳細を見る
• 2004-09-15

著者

• Chang Chun

  Department Of Electronics Engineering National Chiao Tung University

• Chang C‐y

  Department Of Electronics Engineering National Chiao Tung University

• Huang Guo-wei

  National Nano Device Laboratories

• Huang Guo‐wei

  National Nano Device Laboratories

• CHANG Chun-Yen

  Department of Electronics Engineering, National Chiao Tung University

• CHANG Chun-Yen

  National Nano Device Laboratories

• Chien C‐h

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Chang Chun-yen

  Department Of The Electro-optical Engineering National Chiao Tung University

• HU Hsin-Hui

  Department of Electronics Engineering, National Chiao Tung University

• CHEN Kun-Ming

  National Nano Device Laboratories

• Chang Chun‐yen

  Institute Of Electronics National Chiao Tung University

• Chang Chun-yen

  Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity

• Huang G‐w

  National Nano Device Laboratories

• Chen Kun‐ming

  National Nano Device Laboratories

• Chang C‐y

  Department Of Electronics Engineering Nation Chiao Tung University

• Hu Hsin-hui

  Department Of Electronics Engineering National Chiao Tung University

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