The Impact of Mixed-mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe HBTs

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概要

• 論文の詳細を見る
• 2007-09-19

著者

• CHANG Chun-Yen

  Department of Electronics Engineering, National Chiao Tung University

• Chang Chun-yen

  Department Of Electronics Engineering National Chiao Tung University

• CHEN Kun-Ming

  National Nano Device Laboratories

• HUANG Sheng-Yi

  United Microelectronics Corporation (UMC)

• HUNG Cheng-Chou

  United Microelectronics Corporation (UMC)

• LIAO Wen-Shiang

  United Microelectronics Corporation (UMC)

• LIN Chun-Yi

  United Microelectronics Corporation (UMC)

• FAN Cheng-Wen

  United Microelectronics Corporation (UMC)

• TZENG Chih-Yuh

  United Microelectronics Corporation (UMC)

• LIANG Victor

  United Microelectronics Corporation (UMC)

• Chung Lee

  United Microelectronic Corporation (umc)

• Chang Chun-yen

  Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity

• Huang Sheng-yi

  United Microelectronic Corporation (umc)

• Chen Kun-ming

  National Nano Device Laboratories (ndl)

• Liang Victor

  United Microelectronics Corporation

• Liao Wen-shiang

  United Microelectronic Corporation (umc)

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