Excellent Au/Ge/Pd Ohmic Contacts to n-type GaAs Using Mo/Ti as the Diffusion Barrier
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-04-15
著者
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Chan Yi-jen
Department Of Electrical Engineering National Central University
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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Chen H‐c
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Cheng H‐c
National Tsing Hua Univ. Hsinchu Twn
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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Cheng Huang‐chung
Nano Electronics And Display Technology Lab. Department Of Electronics Engineering And Institute Of
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Chang Chun-yen
Instiute Of Electronics National Chiao-tang University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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CHENG Huang-Chung
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University
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CHAN Yi-Jen
Dept. of Electrical Engineering, National Central University
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Lai Y‐l
National Changhua Univ. Education Changhua Twn
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Chang Chun-yen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity
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Chan Y‐j
Dept. Of Electrical Engineering National Central University
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CHAI Chun-Yi
Department of Electronics Engineering and Institute of Electronics, Semiconductor Research Center, N
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HUANG Jung-A
Department of Electronics Engineering and Institute of Electronics, Semiconductor Research Center, N
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LAI Yong-Lin
Department of Electronics Engineering and Institute of Electronics, Semiconductor Research Center, N
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WU Janne-Wha
Department of Electronics Engineering and Institute of Electronics, Semiconductor Research Center, N
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Wu J‐w
National Sun Yat‐sen Univ. Kaohsiung Twn
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Cheng Huang-chung
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tang University
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Huang Jung-a
Department Of Electronic Engineering And Institute Of Electronics National Chiao-tung University
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Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
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WU Janne-Wha
Department of Electronic Engineering and Institute of Electronics, National Chiao-Tung University
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