The Behavior of Bilateral Latch-Up Triggering in VLSI Electro Static Discharge Damage Protection Circuits

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1993-11-15

著者

• Chang C‐y

  Department Of Electronics Engineering National Chiao Tung University

• Chang Chun-yen

  Instiute Of Electronics National Chiao-tang University

• Chang Chun-yen

  Department Of The Electro-optical Engineering National Chiao Tung University

• LIN Jyh-Kuang

  Institute of Electronics, National Chiao Tung University

• Chen K‐l

  United Microelectronics Corporation

• Huang Heng-sheng

  United Microelectronics Corporation:instiute Of Electronics National Chiao-tang University

• Lin Jyh-kuang

  Instiute Of Electronics National Chiao-tang University

• Hsu Chen-Chung

  United Microelectronics Corporation

• CHANG Chun-Yen

  United Microelectronics Corporation

• CHEN Kun-Luh

  Institute of Electronics, National Chiao-Tang University

• Chang C‐y

  Department Of Electronics Engineering Nation Chiao Tung University

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