A method for suppressing deep-level emission in ZnSe/Ge/Ge_xSi_<1-x>/Si structure

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概要

• 論文の詳細を見る
• 2006-09-13

著者

• Chang Chun

  Department Of Electronics Engineering National Chiao Tung University

• Chang C‐y

  Department Of Electronics Engineering National Chiao Tung University

• CHANG Chun-Yen

  Department of Electronics Engineering, National Chiao Tung University

• Chang Chun-yen

  Department Of The Electro-optical Engineering National Chiao Tung University

• Chang Chun-yen

  Microelectronics And Information Systems Research Center

• Chang C‐y

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Chou Wu

  Department Of Electrophysics 1001 Ta Hsueh Road National Chiao Tung University

• KU Jui-Tai

  Microelectronics and Information Systems Research Center, Nation Chiao Tung University

• KU Jui-Tai

  Department of Electrophysics, 1001 Ta Hsueh Road, National Chiao Tung University

• YANG Tsung-Hsi

  Microelectronics and Information Systems Research Center

• LUO Guangli

  National Nano Device Laboratories

• YANG Tsung-Yeh

  Institute of Physics, Academia Sinica

• Ku Jui-tai

  Department Of Electrophysics Nation Chiao Tung University

• Yang Tsung-hsi

  Department Of Electronics Engineering Nation Chiao Tung University

• Yang Tsung-hsi

  Department Of Materials Science And Engineering National Chiao Tung University

• Chang C‐y

  Department Of Electronics Engineering Nation Chiao Tung University

• Yang Tsung

  Department Of Electronics Engineering Nation Chiao Tung University

• Ku Jui

  Department Of Electrophysics Nation Chiao Tung University

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