Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2005-06-15

著者

• Chang C‐y

  Department Of Electronics Engineering National Chiao Tung University

• Huang Guo-wei

  National Nano Device Laboratories

• CHANG Chun-Yen

  Department of Electronics Engineering, National Chiao Tung University

• Chien C‐h

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• HU Hsin-Hui

  Department of Electronics Engineering, National Chiao Tung University

• CHEN Kun-Ming

  National Nano Device Laboratories

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