Huang Guo-wei | National Nano Device Laboratories
スポンサーリンク
概要
関連著者
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Huang Guo-wei
National Nano Device Laboratories
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CHEN Kun-Ming
National Nano Device Laboratories
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Huang G‐w
National Nano Device Laboratories
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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Chien C‐h
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity
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Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
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Huang Guo‐wei
National Nano Device Laboratories
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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Chang Chun
Department Of Electronics Engineering National Chiao Tung University
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CHANG Chun-Yen
National Nano Device Laboratories
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Chang Chun‐yen
Institute Of Electronics National Chiao Tung University
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Chen Kun‐ming
National Nano Device Laboratories
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Hu Hsin-hui
Department Of Electronics Engineering National Chiao Tung University
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Yang Yu-chi
United Microelectronics Corporation
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HU Hsin-Hui
Department of Electronics Engineering, National Chiao Tung University
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Meng Chinchun
Department Of Communication Engineering National Chiao Tung University
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CHENG Eric
United Microelectronics Corporation
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MENG Chinchun
Department of Communication Engineering, National Chiao Tung University
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CHIU Chia-Sung
National Nano Device Laboratories
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Wu Tse-hung
Department Of Communication Engineering National Chiao Tung University
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CHEN Kim-Ming
National Nano Device Laboratories
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Chen Han
Department Of Electronics Engineering National Chiao Tung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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LU Yii-Chian
United Microelectronics Corporation
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CHEN Liang-Po
National Nano Device Laboratory
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Chen L‐p
National Nano Device Laboratories
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HUANG Guo-Wei
Institute of Electronics, National Chiao Tung University
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TSAI Wen-Chung
Department of Electronic Engineering and Institute of Electronics, National Chiao-Tung University
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Tsai Wen-chung
Department Of Electronic Engineering And Institute Of Electronics National Chiao-tung University
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Chen Liang-po
National Nano Device Laboratories
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Wu Tzung-han
Department Of Communication Engineering National Chiao Tung University
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Meng Chinchun
National Chiao Tung Univ. Hsinchu Twn
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Chang Chun-yen
Institute Of Electronics National Chiao Tang University:national Nano-device Laboratories
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Chen Kun-Ming
National Nano Device Laboratories, Hsinchu 300, Taiwan
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CHEN Han-Yu
Department of Electronics Engineering, National Chiao Tung University
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Su Pin
Department Of Electronics Engineering National Chiao Tung University
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Chang Chun-yen
Instiute Of Electronics National Chiao-tang University
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HUNG Cheng-Chou
United Microelectronics Corporation (UMC)
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WU Tzung-Han
Department of Communication Engineering, National Chiao Tung University
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TSAI Wen-Chung
Institute of Electronics, National Chiao Tung University
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JUNG Tz-Guei
Institute of Electronics, National Chiao Tung University
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WANG Pei-Jih
National Nano Device Laboratory
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JUNG Tz-Guei
Department of Electronic Engineering and Institute of Electronics, National Chiao-Tung University
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Chang T‐c
Department Of Physics National Sun Yat-sen University
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Huang Sheng-yi
United Microelectronic Corporation (umc)
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Chang Li-hsin
National Nano Device Laboratories
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Jung Tz-guei
Department Of Electronic Engineering And Institute Of Electronics National Chiao-tung University
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Liang Victor
United Microelectronics Corporation
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Tseng Hua-chou
United Microelectronics Corporation
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Liao Wen-shiang
United Microelectronic Corporation (umc)
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CHEN Guan-Ji
Department of Materials Science and Engineering, and Microelectronics and Information Systems Resear
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BISWAS D.
Department of Materials Science and Engineering, and Microelectronics and Information Systems Resear
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Cho Ming-hsiang
National Nano Device Laboratories
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Chang T‐c
National Nano Device Laboratories:department Of Physics National Sun Yat-sen University
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Wu Tzung‐han
National Chiao Tung Univ. Hsinchu Twn
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Hu Hsin-Hui
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
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Wang Sheng-Chun
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
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Chang Chun-Yen
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
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Yang Yu-Chi
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Cheng Eric
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Kuo Hao-chung
Department Of Photonic And Institute Of Electro-optical Engineering National Chiao Tung University
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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HUANG Tiao-Yuan
Department of Electronics Engineering, National Chiao Tung University
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Wang T
National Chiao Tung Univ. Hsin‐chu Twn
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Su Jen-yi
Department Of Communication Engineering National Chiao Tung University
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Chang Chun
Department Of Electronic Engineering And Institute Of Electronics National Chiao-tung University
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YEH Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung
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Chen Zhe-sheng
The Department Of Electronics Engineering National Chiao Tung University
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CHANG Shoou-Jinn
Department of Electrical Engineering, National Cheng Kung University
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HUANG Tiao-Yuan
National Nano Device Laboratory
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LIANG Victor
United Microelectronics Corporation (UMC)
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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LIN Horng-Chih
Institute of Electronics, National Chiao Tung University
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
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Huang Tiao-yuan
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung University
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Lin H‐c
National Nano Device Laboratories
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Lin Horng-chih
Institute Of Electronics National Chiao Tung University
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HUANG Guo
National Nano Devices Laboratories
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CHEN Kun
National Nano Devices Laboratories
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WEN Kuei-Ann
the Department of Electronics Engineering, National Chiao Tung University
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WUEN Wen-Shen
the Department of Electronics Engineering, National Chiao Tung University
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CHEN Kuang-Yu
the Department of Electronics Engineering, National Chiao Tung University
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LIU Shen-Fong
the Department of Electronics Engineering, National Chiao Tung University
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CHANG Chun-Yen
the Department of Electronics Engineering, National Chiao Tung University
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CHEN Kun-Ming
Department of Electronics Engineering & Institute of Electronics, National Chiao Tung University
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HUANG Hsiang-Jen
Department of Electronics Engineering & Institute of Electronics, National Chiao Tung University
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CHAN Yuen-Chang
Department of Electrical Engineering, National Cheng Kung University
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HUANG Guo-Wei
Department of Electronic Engineering and Institute of Electronics,National Chiao-Tung University
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FANG Frank-Fu
Center of Condensed Matter Sciences, National Taiwan University
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CHANG Yang-Hueng
Department of Physics, National Taiwan University
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HUANG Cheua-Feng
Department of Physics, National Taiwan University
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CHANG Ting-Chang
Institute of Electronics, National Chiao Tung University
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Chang Chun-yen
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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CHANC Ting-Chang
Institute of Electronics, National Chiao Tung University
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WANG Tom
Institute of Electronics, National Chiao Tung University
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WEN Kuei-Ann
Institute of Electronics, National Chiao Tung University
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Huang Guo-wei
National Nanometer Device Laboratories
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Liu Shen-fong
The Department Of Electronics Engineering National Chiao Tung University
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Wuen Wen-shen
Institute Of Electronics National Chiao Tung University
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Yeh Wen-kuan
Department Of Electrical Engineering National University Of Kaohsiung
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Chang C‐y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Huang Cheua-feng
Department Of Physics National Taiwan University
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CHANG Edward
Department of Materials Science and Engineering, National Chiao Tung University
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Fang Frank-fu
Center Of Condensed Matter Sciences National Taiwan University
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Chan Yuen-chang
Department Of Electrical Engineering National Cheng Kung University
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Wen K‐a
Institute Of Electronics National Chiao Tung University
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Wen Kuei‐ann
Institute Of Electronics National Chiao Tung University
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Huang Guo
National Nano Device Laboratories
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Chen Kun
National Nano Device Laboratories
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Chen Bo-Yuan
National Museum of Marine Biology & Aquarium (NMMBA)
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Li Yang-han
Department Of Communication Engineering National Chiao Tung University
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Chang Shoou-jinn
Department Of Electrical Engineering National Cheng Kung University
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LIN Yueh-Chin
Department of Materials Science and Engineering, and Microelectronics and Information Systems Resear
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LEE Huang-Ming
Department of Materials Science and Engineering, and Microelectronics and Information Systems Resear
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HSU Tsun-Lai
United Microelectronics Corporation
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Lee Huang-ming
Department Of Materials Science And Engineering National Chiao Tung University
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TSENG Sheng-Che
Department of Communication Engineering, National Chiao Tung University
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TSOU Bo-Chen
Department of Electrical Engineering, National Chung-Hsing University
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PENG An-Sam
National Nano Device Laboratories
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Tsou Bo-chen
Department Of Electrical Engineering National Chung-hsing University
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Lee Huang-ming
Department Of Materials Science And Engineering Microelectronics And Information Systems Research Ce
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Tseng Sheng-che
Department Of Communication Engineering National Chiao Tung University
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Chang Yang-hueng
Department Of Physics National Taiwan University
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Huang Hsiang-jen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung University
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Chang Edward
Department Of Communications Engineering Yuan Ze University
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Lin Yueh-chin
Department Of Materials Science And Engineering National Chiao-tung University
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Chien Alex
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Huang Fon-Shan
Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 300, Taiwan
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Lin Chien-Ting
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Chang Edward
Department of Materials Science and Engineering, and Microelectronics and Information Systems Research Center, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Wu Tse-Hung
Department of Communication Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Wu Tzung-Han
Department of Communication Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Lien Chen-Hsin
Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan
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Chang Chun-Yen
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Yeh Wen-Kuan
Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung 811, Taiwan
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Lin Yueh-Chin
Department of Materials Science and Engineering, and Microelectronics and Information Systems Research Center, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Lee Huang-Ming
Department of Materials Science and Engineering, and Microelectronics and Information Systems Research Center, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Liao Wen-Shiang
United Microelectronics Corporation (UMC), Hsinchu 30078, Taiwan
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Liao Wen-Shiang
United Microelectronics Corporation (UMC), No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Chen Yu-Ting
Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
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Hu Hsin-Hui
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Chen Kun-Ming
National Nano Device Laboratories, Hsinchu 30078, Taiwan
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Ku Chia-Lin
Chung Yuan Christian University, Department of Electronic Engineering, 200, Chung Pei Rd., Chungli, Taiwan 32023, R.O.C.
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Chang Ching-Chun
Chung Yuan Christian University, Department of Electronic Engineering, 200, Chung Pei Rd., Chungli, Taiwan 32023, R.O.C.
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Peng Kang-Ming
Chung Yuan Christian University, Department of Electronic Engineering, 200, Chung Pei Rd., Chungli, Taiwan 32023, R.O.C.
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Jeng Erik
Chung Yuan Christian University, Department of Electronic Engineering, 200, Chung Pei Rd., Chungli, Taiwan 32023, R.O.C.
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Chen Wen-Lin
National Nano Device Laboratories, No. 26, Prosperity Rd. I, Science-based Industrial Park, Hsinchu, Taiwan 30078, R.O.C.
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Wu Lin-Kun
National Chiao Tung University, Department of Communication Engineering, 1001 University Road, Hsinchu, Taiwan 300, R.O.C.
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Hung Cheng-Chou
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Hung Cheng-Chou
United Microelectronics Corporation (UMC), No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Biswas D.
Department of Materials Science and Engineering, and Microelectronics and Information Systems Research Center, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Huang Fon-Shan
Institute of Electronics Engineering, National Tsing Hua University, 101, Sec. 2, Kuang-Fu Road, Hsinchu 30013, Taiwan
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Huang Sheng-Yi
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Huang Sheng-Yi
United Microelectronics Corporation (UMC), No. 3, Li-Hsin Rd. II, Hsinchu 300, Taiwan
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Su Pin
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
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Huang Guo-Wei
National Nano Device Laboratories, Hsinchu, Taiwan, R.O.C.
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Huang Guo-Wei
National Nano Device Laboratories, Hsinchu 300, Taiwan, R.O.C.
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Huang Guo-Wei
National Nano Device Laboratories, No. 26, Prosperity Rd. I, Science-based Industrial Park, Hsinchu, Taiwan 30078, R.O.C.
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Huang Guo-Wei
National Nano Device Laboratories, Hsinchu 30078, Taiwan
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Huang Guo-Wei
National Nano Device labratories, Hsinchu 300, Taiwan, R.O.C.
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Chen Guan-Ji
Department of Materials Science and Engineering, and Microelectronics and Information Systems Research Center, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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Liang Victor
United Microelectronics Corporation, Hsinchu 300, Taiwan
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Huang Fon-Shan
Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
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Chiu Chia-Sung
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Chiu Chia-Sung
National Nano Device Laboratories, No. 26, Prosperity Rd. I, Science-based Industrial Park, Hsinchu, Taiwan 30078, R.O.C.
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Cho Ming-Hsiang
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Meng Chinchun
Department of Communication Engineering, National Chiao Tung University, Hsinchu, Taiwan, R.O.C.
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Mou Zong-Wen
Department of Photonics, National Chiao Tung University, Hsinchu 300, Taiwan
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Liu Wen-De
National Nano Device Laboratories, Hsinchu 300, Taiwan
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Chen Ming-Yi
United Microelectronics Corporation, Hsinchiu 300, Taiwan
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Wang Kai-Li
United Microelectronics Corporation, Hsinchiu 300, Taiwan
著作論文
- A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millim
- Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors
- Characterization of RF LDMOS Transistors with Different Layout Structures
- Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress
- Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress
- Low-Frequency Noise in Partially Depleted SOI MOSFETs Operating from Linear Region to Saturation Region at Various Temperatures
- A 5.2GHz 47dB Image Rejection Double Quadrature Gilbert Downconverter Using 0.35μm SiGe HBT Technology(Analog Circuit Techniques and Related Topics)
- A 5.7 GHz Gilbert Upconversion Mixer with an LC Current Combiner Output Using 0.35μm SiGe HBT Technology(RF, Analog Circuit and Device Technologies)
- Noise Parameters Computation of Microwave Devices Using Genetic Algorithms(Active Circuits & Antenna, Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Appli
- A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit(Model, Analog Circuit and Device Technologies)
- CMOS RFIC : Application to Wireless Transceiver Design (Special Issue on Low-Power High-Speed CMOS LSI Technologies)
- P-Channel Metal Oxide Semiconductor Field Effect Transistors with Polycrystalline-Si_Ge_x Gate Grown by Ultra-High Vacuum Chemical Vapor Deposition System
- Direct Oxidation of Si_Ge_x Layers Using Vacuum-Ultra-Violet Light Radiation in Oxygen
- Very High Hole Mobility in P-Type Si/SiGe Modulation-Doped Heterostructures
- Characterization of Si/SiGe Strained-Layer Superlattices Grown by an Ultrahigh Vacuum/Chemical Vapor Deposition Technique
- Low-Temperature Epitaxial Growth of Silicon and Silicon-Germanium Alloy by Ultrahigh-Vacuum Chemical Vapor Deposition
- Composite-Channel Metamorphic High Electron Mobility Transistor for Low-Noise and High-Linearity Applications
- Pulsed Characteristics of Microwave SiGe Heterojunction Bipolar Transistors Operated at High Collector Voltages
- High-Frequency Characteristics of SiGe Heterojunction Bipolar Transistors under Pulsed-Mode Operation(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devi
- The Port-to-Port Isolation the Downconversion P-Type Micromixer Using Different N-Well Topologies(Advanced RF Technologies for Compact Wireless Equipment and Mobile Phones)
- The Effect of Selectively and Fully Ion-Implanted Collector on RF Characteristics of BJT Devices(Advanced RF Technologies for Compact Wireless Equipment and Mobile Phones)
- Design and Analysis of On-Chip Tapered Transformers for Silicon RFICs
- Investigation of Hot-Carrier Stress Effect on High-Frequency Performance of Laterally Diffused Metal-Oxide-Semiconductor Transistors (Special Issue : Solid State Devices and Materials (1))
- Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal–Oxide–Semiconductor Field-Effect Transistors
- Analysis of Temperature Effects on High-Frequency Characteristics of RF Lateral-Diffused Metal–Oxide–Semiconductor Transistors
- Radio-Frequency Silicon-on-Insulator Modeling Considering the Neutral-Body Effect
- Composite-Channel Metamorphic High Electron Mobility Transistor for Low-Noise and High-Linearity Applications
- Characterization of RF Lateral-Diffused Metal–Oxide–Semiconductor Field-Effect Transistors with Different Layout Structures
- Low-Frequency Noise in Partially Depleted SOI MOSFETs Operating from Linear Region to Saturation Region at Various Temperatures
- Effect of Mixed-Mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe Hetero-Junction Bipolar Transistors
- Low-Frequency Noise Characteristics of SiGe p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with High-Compressive Interlayer-Dielectric-SiNx Stressing Layer
- Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress
- Implementation of Surface Acoustic Wave Vapor Sensor Using Complementary Metal–Oxide–Semiconductor Amplifiers
- Design and Analysis of On-Chip Tapered Transformers for Silicon Radio-Frequency Integrated Circuits
- A Monolithic SiGe Heterojunction Bipolar Transistor Gilbert Upconverter with Inductor–Capacitor Current Mirror Load and Lumped-Element Rat-Race Balun