Chen Kun | National Nano Device Laboratories
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概要
関連著者
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HUANG Guo
National Nano Devices Laboratories
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CHEN Kun
National Nano Devices Laboratories
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Huang Guo
National Nano Device Laboratories
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Chen Kun
National Nano Device Laboratories
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Chen Kun‐ming
National Nano Device Laboratories
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Chang Chun
Department Of Electronics Engineering National Chiao Tung University
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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Huang Guo-wei
National Nano Device Laboratories
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Huang Guo‐wei
National Nano Device Laboratories
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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CHANG Chun-Yen
National Nano Device Laboratories
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Chien C‐h
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chen Han
Department Of Electronics Engineering National Chiao Tung University
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Chang Chun
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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Chang Chun
Department Of Electronic Engineering And Institute Of Electronics National Chiao-tung University
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CHEN Kun-Ming
National Nano Device Laboratories
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Chang Chun‐yen
Institute Of Electronics National Chiao Tung University
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Teng Yu
National Nano Device Laboratories
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Huang G‐w
National Nano Device Laboratories
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Tseng Hua
United Microelectronics Corporation
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Cho Ming-hsiang
Department Of Communication Engineering National Chiao-tung University
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Cho Ming
National Nano Device Laboratories
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Hsu Tsun
United Microelectronics Corporation
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WU Shih
Institute of Electronics, National Chiao Tung University
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Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
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Wu Shih
Institute Of Electronics National Chiao Tung University
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CHIU Chia
National Nano Device Laboratories
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PENG An
National Nano Device Laboratories
著作論文
- Noise Parameters Computation of Microwave Devices Using Genetic Algorithms(Active Circuits & Antenna, Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Appli
- RF MOSFET Characterization by Four-Port Measurement(Microelectronic Test Structures)
- A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement(Microelectronic Test Structures)