CHEN Kim-Ming | National Nano Device Laboratories
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概要
関連著者
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Huang Guo-wei
National Nano Device Laboratories
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CHEN Kim-Ming
National Nano Device Laboratories
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Huang G‐w
National Nano Device Laboratories
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CHEN Kun-Ming
National Nano Device Laboratories
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Chang Li-hsin
National Nano Device Laboratories
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Tseng Hua-chou
United Microelectronics Corporation
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Chang Chun
Department Of Electronics Engineering National Chiao Tung University
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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Huang Guo‐wei
National Nano Device Laboratories
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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CHEN Han-Yu
Department of Electronics Engineering, National Chiao Tung University
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CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
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HUANG Tiao-Yuan
Department of Electronics Engineering, National Chiao Tung University
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CHANG Chun-Yen
National Nano Device Laboratories
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Chien C‐h
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chen Han
Department Of Electronics Engineering National Chiao Tung University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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HUANG Tiao-Yuan
National Nano Device Laboratory
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LIANG Victor
United Microelectronics Corporation (UMC)
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
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Huang Tiao-yuan
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung University
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Chang Chun‐yen
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity
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Liang Victor
United Microelectronics Corporation
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HSU Tsun-Lai
United Microelectronics Corporation
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Chen Kun‐ming
National Nano Device Laboratories
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Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
著作論文
- A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millim
- Pulsed Characteristics of Microwave SiGe Heterojunction Bipolar Transistors Operated at High Collector Voltages
- High-Frequency Characteristics of SiGe Heterojunction Bipolar Transistors under Pulsed-Mode Operation(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devi