HU Hsin-Hui | Department of Electronics Engineering, National Chiao Tung University

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概要

• HU Hsin-Huiの詳細を見る
• 同名の論文著者
• Department of Electronics Engineering, National Chiao Tung Universityの論文著者

関連著者

• Chang C‐y

  Department Of Electronics Engineering National Chiao Tung University

• Huang Guo-wei

  National Nano Device Laboratories

• CHANG Chun-Yen

  Department of Electronics Engineering, National Chiao Tung University

• Chien C‐h

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• HU Hsin-Hui

  Department of Electronics Engineering, National Chiao Tung University

• CHEN Kun-Ming

  National Nano Device Laboratories

• Chang Chun

  Department Of Electronics Engineering National Chiao Tung University

• Huang Guo‐wei

  National Nano Device Laboratories

• CHANG Chun-Yen

  National Nano Device Laboratories

• Chang Chun-yen

  Department Of The Electro-optical Engineering National Chiao Tung University

• Chang Chun‐yen

  Institute Of Electronics National Chiao Tung University

• Chang Chun-yen

  Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity

• Huang G‐w

  National Nano Device Laboratories

• Chen Kun‐ming

  National Nano Device Laboratories

• Chang C‐y

  Department Of Electronics Engineering Nation Chiao Tung University

• Hu Hsin-hui

  Department Of Electronics Engineering National Chiao Tung University

• Yang Yu-chi

  United Microelectronics Corporation

• LU Yii-Chian

  United Microelectronics Corporation

• CHENG Eric

  United Microelectronics Corporation

• YEH Wen-Kuan

  Department of Electrical Engineering, National University of Kaohsiung

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著作論文

• Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors
• Characterization of RF LDMOS Transistors with Different Layout Structures
• Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress
• Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress
• Low-Frequency Noise in Partially Depleted SOI MOSFETs Operating from Linear Region to Saturation Region at Various Temperatures

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