LU Yii-Chian | United Microelectronics Corporation
スポンサーリンク
概要
関連著者
-
Huang Guo-wei
National Nano Device Laboratories
-
Yang Yu-chi
United Microelectronics Corporation
-
CHEN Kun-Ming
National Nano Device Laboratories
-
LU Yii-Chian
United Microelectronics Corporation
-
CHENG Eric
United Microelectronics Corporation
-
Chang Chun-yen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity
-
Hu Hsin-hui
Department Of Electronics Engineering National Chiao Tung University
-
Chang Chun
Department Of Electronics Engineering National Chiao Tung University
-
Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
-
Huang Guo‐wei
National Nano Device Laboratories
-
CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
-
CHANG Chun-Yen
National Nano Device Laboratories
-
Chien C‐h
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
-
Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
-
HU Hsin-Hui
Department of Electronics Engineering, National Chiao Tung University
-
Chang Chun‐yen
Institute Of Electronics National Chiao Tung University
-
Huang G‐w
National Nano Device Laboratories
-
Chen Kun‐ming
National Nano Device Laboratories
-
Chang C‐y
Department Of Electronics Engineering Nation Chiao Tung University
-
Chang Chun-Yen
Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan
-
Yang Yu-Chi
United Microelectronics Corporation, Hsinchu 300, Taiwan
-
Cheng Eric
United Microelectronics Corporation, Hsinchu 300, Taiwan
著作論文
- Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors
- Characterization of RF LDMOS Transistors with Different Layout Structures
- Characterization of RF Lateral-Diffused Metal–Oxide–Semiconductor Field-Effect Transistors with Different Layout Structures