Improvement of Mesa-Sidewall Leakage Current Using Benzocyclobuten Sidewall Process in InGaAs/InP MSM Photodetector
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概要
- 論文の詳細を見る
- 2005-04-30
著者
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Chan Yi-jen
Department Of Electrical Engineering National Central University
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Shi Jin-wei
Department Of Electrical Engineering National Central University
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CHIU Wei-Yu
Department of Electrical Engineering, National Central University
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HUANG Fan-Hsiu
Department of Electrical Engineering, National Central University
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WU Yen-Shian
Department of Electrical Engineering, National Central University
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LIN Don-Ming
Department of Electrical Engineering, National Central University
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CHEN Shu-Han
Department of Electrical Engineering, National Central University
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CHYI Jen-Inn
Department of Electrical Engineering, National Central University
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Chiu Wei-yu
Department Of Electrical Engineering National Central University
関連論文
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- InP/InGaAs Partially p-Doped Photodiode with Leaky Optical Waveguide and Distributed Bragg Reflectors for High-Saturation-Current and High-Bandwidth-Responsivity Product
- Improvement of Mesa-Sidewall Leakage Current Using Benzocyclobuten Sidewall Process in InGaAs/InP MSM Photodetector
- Reduced Mesa-Sidewall Leakage Current in InGaAs/InP MSM Photodetector by BCB Sidewall Process
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- Extraction of an Empirical Temperature-Dependence InGaP/GaAs HBT Large-Signal Model
- High Linearity and High Power Device Fabricated by Al_Ga_As/In_Ga_As Double Doped-Channel Heterostructure
- Improvement of Mesa-Sidewall Leakage Current Using Benzocyclobuten Sidewall Process in InGaAs/InP MSM Photodetector
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