Chen Kun-ming | National Nano Device Laboratories (ndl)
スポンサーリンク
概要
関連著者
-
CHEN Kun-Ming
National Nano Device Laboratories
-
HUANG Sheng-Yi
United Microelectronics Corporation (UMC)
-
LIAO Wen-Shiang
United Microelectronics Corporation (UMC)
-
Chung Lee
United Microelectronic Corporation (umc)
-
Huang Sheng-yi
United Microelectronic Corporation (umc)
-
Chen Kun-ming
National Nano Device Laboratories (ndl)
-
Liao Wen-shiang
United Microelectronic Corporation (umc)
-
CHANG Chun-Yen
Department of Electronics Engineering, National Chiao Tung University
-
Tsen Huan-chiu
United Microelectronic Corporation (umc)
-
Chang Chun-yen
Department Of Electronics Engineering National Chiao Tung University
-
HUNG Cheng-Chou
United Microelectronics Corporation (UMC)
-
LIN Chun-Yi
United Microelectronics Corporation (UMC)
-
FAN Cheng-Wen
United Microelectronics Corporation (UMC)
-
TZENG Chih-Yuh
United Microelectronics Corporation (UMC)
-
LIANG Victor
United Microelectronics Corporation (UMC)
-
Chang Chun-yen
Department Of Electronics Engineering & Institute Of Electronics National Chiao Tung Uiversity
-
Liang Victor
United Microelectronics Corporation
著作論文
- The Impact of Mixed-mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe HBTs
- 3D Multi-gate NMOS Mobility Enhancement with High-tensile ILD-SiN_x Stressor