PARK Byung-Gook | Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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概要
- 同名の論文著者
- Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compuの論文著者
関連著者
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Lee J
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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LEE Jong
Inter-University Semiconductor Research Center, Seoul National University
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Lee Jong
Inter-univ. Semicon. Res. Center Seoul Nat. Univ.
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Lee J
School Of Electrical Engineering Seoul National University
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Park Byung-gook
School Of Electrical Engineering Seoul National University
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Park Byung‐gook
School Of Electrical Engineering Seoul National University
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Lee Joung-eob
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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LEE Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Lee Jong
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Jong
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc)
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CHO Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Shin Hyungcheol
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Park Byung-gook
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Cho Seongjae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Yun Jang‐gn
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Jong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kang Sangwoo
Seoul National Univ. Seoul Kor
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Sim Jae
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Yun Jang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Yur Jang-gn
School Of Electrical Engineering Seoul National University
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Choi Woo
Inter-university Semiconductor Research Center Seoul National University
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Yun Jang-gn
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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CHOI Woo
Inter-University Semiconductor Research Center, Seoul National University
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Choi W
Inter-university Semiconductor Research Center Seoul National University
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kang Sangwoo
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Park Byung‐gook
Seoul National Univ. Seoul Kor
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Yun Jang-Gn
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Lee Gil
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Park Il
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
School Of Electrical Engineering Seoul National University
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LEE Joung-Eob
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Kim Yoon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Il
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Kang Sangwoo
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Doo-Hyun
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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KANG Sangwoo
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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KANG Kwon-Chil
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Lee Gil
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Jong
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Kim Sang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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CHOI Byung
Inter-University Semiconductor Research Center, Seoul National University
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Choi B
Seoul National Univ. Seoul Kor
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Kim Yoon
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Doo‐hyun
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Choi Byung
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Jong
Interdisciplinary Program in Radiation Applied Life Science, Seoul National University College of Me
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Song Jae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Kim Sang
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Kang Kwon-chil
Inter-university Semiconductor Research Center (isrc):school Of Electrical Engineering And Computer
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Kim Wandong
Inter-university Semiconductor Research Center
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YANG Hong-Seon
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Park Byung-gook
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Jong-Ho
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Jung Keum-dong
Inter-university Semiconductor Research Center (isrc) And Semiconductor Materials And Devices Lab. (
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Park Se
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim K
Seoul National Univ. Seoul Kor
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KIM Dae
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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KIM Kyung
Inter-University Semiconductor Research Center, Seoul National University
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Jung Keum
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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LEE Dong-Seup
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Park B‐g
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim D
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul National Unive
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Woo Dong-soo
Inter-university Semiconductor Research Center Seoul National University
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Lee Y
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Dae
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul National Unive
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Lee Dong-seup
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim D
Seoul National Univ. Seoul Kor
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PARK Sang
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Song Ki-whan
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul National Unive
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Kim Wandong
Seoul National Univ. Seoul Kor
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Kim Kyung
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Woo Dong-soo
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Kim Sang
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Yang Hong‐seon
Seoul National Univ. Seoul Kor
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SUNG Suk-Kang
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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PARK Dong-Wook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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Li Dong
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Se
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Li Dong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Sung Suk-kang
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Shim Won
Seoul National Univ. Seoul Kor
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LEE Dong
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Choi Young
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Wan Kim
Inter-University Semiconductor Research Center (ISRC)
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LEE Cheon
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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SUNG Suk
Inter-University Semiconductor Research Center, School of Electrical Engineering, Seoul Nat'l Univ.
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Partk Se
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoo
Inter-University Semiconductor Research Center (ISRC), Seoul National University
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LEE Jong-Duk
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Sung Suk
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Cheon
Inter-university Semiconductor Research Center (isrc) And Semiconductor Materials And Devices Lab. (
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Park Sang
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Sim J‐s
Seoul National Univ. Seoul Kor
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Kim Dae-hwan
School Of Electrical Engineering Kookmin University
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Song Ki-whan
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Kim Hyun
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Lee Young
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Kim Chung
MD Lab., Samsung Advanced Institute of Technology
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Park Dong
Device Research Team, R&D Center, Samsung Electronics Co. Ltd.
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Kim Chung
Md Lab. Samsung Advanced Institute Of Technology
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Lee Jong-eob
Inter-University Semiconductor Research Center (ISRC)
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SIM Jae-Sung
Inter-University Semiconductor Research Center, Seoul National University
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Kim Yun
Inter-university Semiconductor Research Center (ISRC)
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JEON Jongwook
Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University
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SONG Ickhyun
Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University
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Lee Gil-Seong
Inter-university Semiconductor Research Center, Seoul National University
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YUN Jang
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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PARK Il-Han
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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KIM Jin-Ho
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Lee Myeong
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Gil-seong
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Y‐t
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Y‐t
Department Of Information & Communications Kjist
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Shim Wonbo
Inter-university Semiconductor Research Center
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JEONG Hoon
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Dong
Device Research Team R&d Center Samsung Electronics Co. Ltd.
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Kang In
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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KIM Hyun
Inter-University Semiconductor Research Center, School of Electrical Engineering, Seoul Nat'l Univ.
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HUH Jung
Inter-University Semiconductor Research Center, School of Electrical Engineering, Seoul Nat'l Univ.
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LEE Yeong-Taek
Inter-University Semiconductor Research Center, School of Electrical Engineering, Seoul Nat'l Univ.
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Wan Kim
Inter-university Semiconductor Research Center (isrc):school Of Electrical Engineering And Computer
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Young
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Yeun
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Hyun
Division Of Nanoscale Semiconductor Engineering Hanyang University
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Lee Young-tae
Department Of Electrical And Electronic Engineering Toyohashi University Of Technology
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Park Dong-wook
Inter-university Semiconductor Research Center (isrc) And Semiconductor Materials And Devices Lab. (
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Kim Byeong-ju
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Sim Jae-sung
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Choi Woo
Department Of Dermatology Sanggye Paik Hospital Inje University College Of Medicine
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WOO Dong
Inter-University Semiconductor Research Center, Seoul National University
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CHUNG Kyung-Hoon
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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LEE Yong
School of Electrical Engineering, Seoul National University
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CHAE Soo
Microelectronics lab., Samsung Advanced Institute of Technology
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KIM Byung
Microelectronics lab., Samsung Advanced Institute of Technology
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CHO Bum
Institute of Quantum Information Processing and Systems (iQUIPS), University of Seoul
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HWANG Sung
Institute of Quantum Information Processing and Systems (iQUIPS), University of Seoul
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AHN Doyeol
Institute of Quantum Information Processing and Systems (iQUIPS), University of Seoul
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CHOI Bum
Institute of Quantum Information Processing and Systems (iQUIPS), University of Seoul
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PARK Han
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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KIM Dae-Hwan
School of Electrical Engineering, Kookmin University
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KIM Byeong-Ju
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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JIN Sung
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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YI Sang
School of Mechanical and Aerospace Engineering, Seoul National University
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PARK Chang
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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CHU Chong
School of Mechanical and Aerospace Engineering, Seoul National University
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SHIN Hyung
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Choi B
Univ. Seoul Seoul Kor
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Cho Bum
Institute Of Quantum Information Processing And Systems (iquips) University Of Seoul
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Ahn D
Institute Of Quantum Information Processing And Systems University Of Seoul
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Chae S
Microelectronics Lab. Samsung Advanced Institute Of Technology
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Hwang Sung
Institute Of Quantum Information Processing & System University Of Seoul
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Lee Jo-won
Material And Device Lab. Samsung Advanced Institute Of Technology
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Sim Jae
School Of Electrical Engineering & Inter-university Semiconductor Research Center (isrc) Seoul N
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Song Ickhyun
School Of Electrical Engineering And Computer Science Seoul National University
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Song Ickhyun
Inter-university Semiconductor Research Center (isrc):school Of Electrical Engineering Seoul Nationa
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Song Ickhyun
Dept. Of Eecs Seoul National University
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Kim Moonkyung
Material And Device Lab. Samsung Advanced Institute Of Technology
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LEE Yeun
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Ahn Doyeol
Institute Of Quantum Information & Processing Systems University Of Seoul
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Song Ickhyun
Inter-university Semiconductor Research Center (isrc) And School Of Ee Seoul National University
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LEE Yong
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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SONG Ki
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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PARK Donggun
Device Research Team, R&D Center, Samsung Electronics Co.
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CHUNG Chilhee
C&M, System LSI, Samsung Electronics Co.
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BAEK Gwanghyeon
Inter-University Semiconductor Research Center, School of Electrical Engineering, Seoul National Uni
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Chung Chilhee
C&m System Lsi Samsung Electronics Co.
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Lee long
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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Lee Long
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Kim B
Microelectronics Lab. Samsung Advanced Institute Of Technology
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Yi Sang
School Of Mechanical And Aerospace Engineering Seoul National University
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Chu Chong
School Of Mechanical And Aerospace Engineering Seoul National University
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Park Donggun
Device Research Team
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Park Donggun
Device Research Team R&d Center Samsung Electronics Co.
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Jeon Jongwook
Inter-university Semiconductor Research Center (isrc) And School Of Ee Seoul National University
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Chung Kyung-hoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Juhyung
Material And Device Lab. Samsung Advanced Institute Of Technology
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Jeong Younseok
Material And Device Lab. Samsung Advanced Institute Of Technology
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Lee Joung‐eob
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Byung-gook
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Lee Yong
School Of Earth And Environmental Sciences Seoul National University
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CHAE Soodoo
Material and Device Lab., Samsung Advanced Institute of Technology
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LEE Changju
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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SUNG Sukkang
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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SIM Jaeseong
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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YOON Sewook
Material and Device Lab., Samsung Advanced Institute of Technology
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RYU Wonil
Material and Device Lab., Samsung Advanced Institute of Technology
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KIM Taehun
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul Na
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KIM Chungwoo
Material and Device Lab., Samsung Advanced Institute of Technology
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Park Il-han
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Huh Jung
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Kim Jin-ho
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Song Ki
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Shin Hyung
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
著作論文
- Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an n-Doped Layer
- A new cone-type 1T DRAM cell (Electron devices)
- Independent Gate Twin-bit SONOS flash memory with split-gate effect (Silicon devices and materials)
- Side-Gate Design Optimization of 50nm MOSFETs with Electrically Induced Source/Drain
- Side-gate Length Optimization for 50nm Induced Source/Drain MOSFETs
- Nanoscale SONOS Flash Memories(Session B6 Si-Devices II)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Nanoscale SONOS Flash Memories(Session B6 Si-Devices II)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Characteristic of Dual-Gate Single Electron Transistor (DG-SET) with extended channel using shallow doping and sidewall patterning for suppressing MOS current(Session 9B : Nano-Scale devices and Physics)
- A New Cone-Type 1T DRAM Cell(Session 2A : Memory 1)
- A New Cone-Type 1T DRAM Cell(Session 2A : Memory 1)
- Characteristic of Dual-Gate Single Electron Transistor (DG-SET) with extended channel using shallow doping and sidewall patterning for suppressing MOS current(Session 9B : Nano-Scale devices and Physics)
- Nanoscale Multi-Line Patterning Using Sidewall Structure
- Single-Electron MOS Memory with a Defined Quantum Dot Based on Conventional VLSI Technology
- Single-Electron Transistors with Sidewall Depletion Gates on a Silicon-On-Insulator Nano-Wire
- Single Electron Memory with a Defined Poly-Si Dot Based on Conventional VLSI Technology
- Room Temperature Coulomb Oscillation of a Single Electron Switch with an Electrically Formed Quantum Dot and Its Modeling
- Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect(Session 8A : Memory 2)
- Design and Simulation of Self-Aligned Vertical Island Single Electron Transistor (VI-SET) with Electrical Tunneling Barrier
- Study on Dependence of Self-Boosting Channel Potential on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices
- Design and Simulation of Self-Aligned Vertical Island Single Electron Transistor (VI-SET) with Electrical Tunneling Barrier
- Study on Dependence of Self-Boosting Channel Potential on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices
- Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for Room Temperature Operation
- Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design
- Charge Injection Path of Bottom-Contact Organic Thin-Film Transistors(Session4B: Emerging Devices II)
- Design of Vertical Nonvolatile Memory Device Considering Gate-Induced Barrier Lowering (GIBL)(Session4A: Nonvolatile Memory)
- 3-dimensional Terraced NAND (3D TNAND) Flash Memory(Session4A: Nonvolatile Memory)
- Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for room temperature operation(Session3: Emerging Devices I)
- Charge Injection Path of Bottom-Contact Organic Thin-Film Transistors(Session4B: Emerging Devices II)
- Design of Vertical Nonvolatile Memory Device Considering Gate-Induced Barrier Lowering (GIBL)(Session4A: Nonvolatile Memory)
- 3-dimensional Terraced NAND (3D TNAND) Flash Memory(Session4A: Nonvolatile Memory)
- Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for room temperature operation(Session3: Emerging Devices I)
- Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme
- Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI)
- Self-Aligned Dual-Gate Single-Electron Transistors (DG-SETs)
- An Analytic Current-Voltage Equation for Top-contact OTFTs Including the Effects of Variable Series Resistance
- Low Hysteresis Organic Thin-Film Transistors and Inverters with Hybrid Gate Dielectric
- Pentacene TFTs Fabricated by High-aspect Ratio Metal Shadow Mask
- Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect(Session 2A : Memory 1)
- Independent Gate Twin-bit SONOS Flash Memory with Split-gate Effect(Session 8A : Memory 2)
- Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect(Session 2A : Memory 1)
- Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory
- Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory
- Simulation of Retention Characteristics in Double-Gate Structure Multi-bit SONOS Flash Memory(Session4A: Nonvolatile Memory)
- Simulation of Retention Characteristics in Double-Gate Structure Multi-bit SONOS Flash Memory(Session4A: Nonvolatile Memory)
- Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices(Novel MOSFET Structures,Fundamentals and Applications of Advanced Semiconductor Devices)
- Capacitorless DRAM Cell with Highly Scalable Surrounding Gate Structure
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles(Session 7A Silicon Devices IV,AWAD2006)
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles(Session 7A Silicon Devices IV,AWAD2006)
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles
- Simulation Study on Dependence of Channel Potential Self-Boosting on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices
- Simulation of Gate-All-Around Tunnel Field-Effect Transistor with an n-Doped Layer
- Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory
- 3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array
- Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for Room Temperature Operation
- Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design
- Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme
- Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI)
- Full-swing pentacene organic inverter with long-channel driver and short-channel load
- A Highly Scalable Split-Gate SONOS Flash Memory with Programmable-Pass and Pure-Select Transistors for Sub-90-nm Technology
- Silicon Quantum Tunneling Devices - FIBTET and MOSET
- Analytical Modeling of Realistic Single-Electron Transistors Based on Metal-Oxide-Semiconductor Structure with a Unique Distribution Function in the Coulomb-Blockade Oscillation Region
- Indium Doped nMOSFETs and Buried Channel pMOSFETs with n^+ Polysilicon Gate
- Channel Doping Engineering with Indium as an Alternative p-Type Dopant
- Nanoscale Poly-Si Line Formation and Its Uniformity
- Nanoscale Poly-Si Line Formation and Its Uniformity
- Design and Simulation of Asymmetric MOSFETs(Junction Formation and TFT Reliability,Fundamentals and Applications of Advanced Semiconductor Devices)
- Novel Gate-All-Around MOSFETs with Self-Aligned Structure
- Multi-Functionality of Novel Structured Tunneling Devices
- Junction Leakage Characteristics of Shallow Trench Isolation (STI) with Nitrogen Pile-Up Sidewall Oxide(AWAD2003 : Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices)
- Junction Leakage Characteristics of Shallow Trench Isolation (STI) with Nitrogen Pile-Up Sidewall Oxide(AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
- Design and Simulation of Asymmetric MOSFETs(Session 7A Silicon Devices IV,AWAD2006)
- Design and Simulation of Asymmetric MOSFETs(Session 7A Silicon Devices IV,AWAD2006)
- Design and Simulation of Asymmetric MOSFETs
- Integration Process of Impact-Ionization Metal-Oxide-Semiconductor Devices with Tunneling Field-Effect-Transistors and Metal-Oxide-Semiconductor Field-Effect Transistors
- Stable Extraction of Threshold Voltage Using Transconductance Change Method for CMOS Modeling, Simulation and Characterization
- Reverse-Order Source/Drain with Double Offset Spacer (RODOS) for Sub-5Onm Low-Power and High-Speed MOSFET Design(AWAD2003 : Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices)
- Reverse-Order Source/Drain with Double Offset Spacer (RODOS) for Sub-50nm Low-Power and High-Speed MOSFET Design (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
- Side-Gate Design for 50nm Electrically Induced Source/Drain MOSFETs
- Side-gate Length Optimization for 50nm Induced Source/Drain MOSFETs
- 70nm NMOSFET Fabrication with 12nm n^+-p Junctions Using As^+_2 Low Energy Implantations
- Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL)
- Design and simulation of single hole transistor with tunneling barrier formed by fixed charge (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Design and simulation of single hole transistor with tunneling barrier formed by fixed charge (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- 70nm Silicon-Oxide-Nitride-Oxide-Silicon Nonvolatile Memory Devices Using Fowler-Nordheim Programming and Hot Hole Erase Method
- Investigation of Threshold Voltage Disturbance Caused by Programmed Adjacent Cell in Virtual Source/Drain NAND Flash Memory
- Non-Quasi-Static Modeling of Silicon Nanowire Metal–Oxide–Semiconductor Field-Effect Transistor and Its Model Verification up to 1 THz
- Fin and Recess-Channel Metal Oxide Semiconductor Field Effect Transistor for Sub-50 nm Dynamic Random Access Memory Cell
- Program/Erase Model of Nitride-Based NAND-Type Charge Trap Flash Memories
- Room-Temperature Operation of a Single-Electron Transistor Made by Oxidation Process Using the Recessed Channel Structure
- Dual Gate Single-Electron Transistors with a Recessed Channel and Underlapped Source/Drain Structure
- Fabrication of Highly Scaled Silicon Nanowire Gate-All-Around Metal–Oxide–Semiconductor Field Effect Transistors by Using Self-Aligned Local-Channel V-gate by Optical Lithography Process
- Silicon-Based Dual-Gate Single-Electron Transistors for Logic Applications
- Random Telegraph Signal-Like Fluctuation Created by Fowler–Nordheim Stress in Gate Induced Drain Leakage Current of the Saddle Type Dynamic Random Access Memory Cell Transistor
- Extraction of Interface-States Energy Distribution in Nitrided and Pure Gate Dielectrics for Metal Oxide Semiconductor Field Effect Transistor Applications
- Self-Aligned Dual-Gate Single-Electron Transistors
- Design Guideline of Si-Based L-Shaped Tunneling Field-Effect Transistors
- Novel Protruded-Shape Unipolar Resistive Random Access Memory Structure for Improving Switching Uniformity through Excellent Conductive Filament Controllability
- Variation of Threshold Voltage and ON-Cell Current Caused by Cell Gate Length Fluctuation in Virtual Source/Drain NAND Flash Memory
- Effects of Conductive Defects on Unipolar RRAM for the Improvement of Resistive Switching Characteristics
- Novel Three Dimensional (3D) NAND Flash Memory Array Having Tied Bit-line and Ground Select Transistor (TiGer)
- Comparative Study on Top- and Bottom-Source Vertical-Channel Tunnel Field-Effect Transistors
- Study on Threshold Voltage Control of Tunnel Field-Effect Transistors Using V_T-Control Doping Region
- Design of Thin-Body Double-Gated Vertical-Channel Tunneling Field-Effect Transistors for Ultralow-Power Logic Circuits
- Stable Extraction of Threshold Voltage Using Transconductance Change Method for CMOS Modeling, Simulation and Characterization
- Electrically Stable Organic Thin-Film Transistors and Circuits Using Organic/Inorganic Double-Layer Insulator
- Self-Aligned Asymmetric Metal–Oxide–Semiconductor Field Effect Transistors Fabricated on Silicon-on-Insulator
- Capacitorless Dynamic Random Access Memory Cell with Highly Scalable Surrounding Gate Structure
- Full-Swing Pentacene Organic Inverter with Long-Channel Driver and Short-Channel Load