Choi Woo | Inter-university Semiconductor Research Center Seoul National University

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概要

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著作論文

Side-Gate Design Optimization of 50nm MOSFETs with Electrically Induced Source/Drain
Side-gate Length Optimization for 50nm Induced Source/Drain MOSFETs
Nanoscale Multi-Line Patterning Using Sidewall Structure
Capacitorless DRAM Cell with Highly Scalable Surrounding Gate Structure
Nanoscale Poly-Si Line Formation and Its Uniformity
Nanoscale Poly-Si Line Formation and Its Uniformity
Design and Simulation of Asymmetric MOSFETs(Junction Formation and TFT Reliability,Fundamentals and Applications of Advanced Semiconductor Devices)
Novel Gate-All-Around MOSFETs with Self-Aligned Structure
Multi-Functionality of Novel Structured Tunneling Devices
Junction Leakage Characteristics of Shallow Trench Isolation (STI) with Nitrogen Pile-Up Sidewall Oxide(AWAD2003 : Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices)
Junction Leakage Characteristics of Shallow Trench Isolation (STI) with Nitrogen Pile-Up Sidewall Oxide(AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
Design and Simulation of Asymmetric MOSFETs(Session 7A Silicon Devices IV,AWAD2006)
Design and Simulation of Asymmetric MOSFETs(Session 7A Silicon Devices IV,AWAD2006)
Design and Simulation of Asymmetric MOSFETs
Integration Process of Impact-Ionization Metal-Oxide-Semiconductor Devices with Tunneling Field-Effect-Transistors and Metal-Oxide-Semiconductor Field-Effect Transistors
Reverse-Order Source/Drain with Double Offset Spacer (RODOS) for Sub-5Onm Low-Power and High-Speed MOSFET Design(AWAD2003 : Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices)
Reverse-Order Source/Drain with Double Offset Spacer (RODOS) for Sub-50nm Low-Power and High-Speed MOSFET Design (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
Side-Gate Design for 50nm Electrically Induced Source/Drain MOSFETs
Side-gate Length Optimization for 50nm Induced Source/Drain MOSFETs
Stable Extraction of Threshold Voltage Using Transconductance Change Method for CMOS Modeling, Simulation and Characterization
Capacitorless Dynamic Random Access Memory Cell with Highly Scalable Surrounding Gate Structure
Novel Gate-All-Around Metal–Oxide–Semiconductor Field Effect Transistors with Self-Aligned Structure

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