Park Il | Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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概要
- Park Il Hanの詳細を見る
- 同名の論文著者
- Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sciの論文著者
関連著者
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Il
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Park Il
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Il
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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CHO Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Lee Jong
Inter-univ. Semicon. Res. Center Seoul Nat. Univ.
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Cho Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Cho Seongjae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Lee J
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc)
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Park Byung‐gook
School Of Electrical Engineering Seoul National University
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LEE Jong
Inter-University Semiconductor Research Center, Seoul National University
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Park Byung-gook
School Of Electrical Engineering Seoul National University
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Shin Hyungcheol
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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LEE Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Lee Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Yun Jang‐gn
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Yun Jang-gn
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Yun Jang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Yur Jang-gn
School Of Electrical Engineering Seoul National University
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Lee J
School Of Electrical Engineering Seoul National University
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Kim Doo-Hyun
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Yun Jang-Gn
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Doo‐hyun
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Joung-eob
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Jong
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Jong
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Kim Doo-Hyun
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Lee Gil
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Lee Gil
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Gil
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Park Byung‐gook
Seoul National Univ. Seoul Kor
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Park Byung-gook
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Kang Sangwoo
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Jong
Interdisciplinary Program in Radiation Applied Life Science, Seoul National University College of Me
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Kim Jong
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kang Sangwoo
Seoul National Univ. Seoul Kor
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KANG Sangwoo
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kang Sangwoo
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Kim Yoon
School Of Electrical Engineering Seoul National University
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Park Byung-gook
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Jong
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-gook
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Wandong
Inter-university Semiconductor Research Center
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Sim Jae
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Jong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Young
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Kim Chung
MD Lab., Samsung Advanced Institute of Technology
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Park Dong
Device Research Team, R&D Center, Samsung Electronics Co. Ltd.
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Kim Chung
Md Lab. Samsung Advanced Institute Of Technology
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Choi Woo
Inter-university Semiconductor Research Center Seoul National University
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Li Dong
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Se
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park B‐g
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Park Se
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Y
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Li Dong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Shim Wonbo
Inter-university Semiconductor Research Center
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JEONG Hoon
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Dong
Device Research Team R&d Center Samsung Electronics Co. Ltd.
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Young
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Wandong
Seoul National Univ. Seoul Kor
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Lee Yeun
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Shim Won
Seoul National Univ. Seoul Kor
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Park Se
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University
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Li Dong
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Choi Woo
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
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CHOI Woo
Inter-University Semiconductor Research Center, Seoul National University
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Choi W
Inter-university Semiconductor Research Center Seoul National University
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Kim Sang
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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YUN Jang
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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LEE Jong-Duk
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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LEE Yeun
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Kang Sangwoo
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Shin Hyungcheol
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
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Kim Wandong
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
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Park Il
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Il
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
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Lee Jong-Duk
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, #059, 599 Gwanangno, Gwanak-gu, Seoul 151-744, Korea
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Lee Jong
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Lee Jong
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Lee Jong
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
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Kang Sangwoo
Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University, ENG 420-016, Sillim-dong, Gwank-gu, Seoul 151-722, Korea
著作論文
- Nanoscale SONOS Flash Memories(Session B6 Si-Devices II)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Nanoscale SONOS Flash Memories(Session B6 Si-Devices II)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Design of Vertical Nonvolatile Memory Device Considering Gate-Induced Barrier Lowering (GIBL)(Session4A: Nonvolatile Memory)
- Design of Vertical Nonvolatile Memory Device Considering Gate-Induced Barrier Lowering (GIBL)(Session4A: Nonvolatile Memory)
- Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory
- Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory
- Simulation of Retention Characteristics in Double-Gate Structure Multi-bit SONOS Flash Memory(Session4A: Nonvolatile Memory)
- Simulation of Retention Characteristics in Double-Gate Structure Multi-bit SONOS Flash Memory(Session4A: Nonvolatile Memory)
- Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices(Novel MOSFET Structures,Fundamentals and Applications of Advanced Semiconductor Devices)
- Capacitorless DRAM Cell with Highly Scalable Surrounding Gate Structure
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles(Session 7A Silicon Devices IV,AWAD2006)
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles(Session 7A Silicon Devices IV,AWAD2006)
- Analyses on Current Characteristics of 3-D MOSFET Nonvolatile Memory Devices Determined by Junction Doping Profiles
- Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory
- 3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array
- Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme
- Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI)
- Extended Word-Line NAND Flash Memory
- Capacitorless Dynamic Random Access Memory Cell with Highly Scalable Surrounding Gate Structure
- Evaluation and Resolution for Nonideal Characteristics of Complementary Metal–Oxide–Semiconductor Devices Fabricated on Silicon-on-Insulator