Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme
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概要
- 論文の詳細を見る
In this paper, characteristics of the 2-bit recessed channel memory with lifted-charge trapping nodes are investigated. The length between the charge trapping nodes through channel, which is defined as the effective memory node length (Meff), is extended by lifting up them. The dependence of VTH window and short channel effect (SCE) on the recessed depth is analyzed. Improvement of short channel effect is achieved because the recessed channel structure increases the effective channel length (Leff). Moreover, this device shows highly scalable memory characteristics without suffering from the bottom-side effect (BSE).
- （社）電子情報通信学会の論文
- 2008-05-01
著者
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LEE Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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CHO Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Park Byung‐gook
School Of Electrical Engineering Seoul National University
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Lee Gil
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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LEE Jong
Inter-University Semiconductor Research Center, Seoul National University
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Park Byung-gook
School Of Electrical Engineering Seoul National University
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Park Il
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Il
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Lee J
School Of Electrical Engineering Seoul National University
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Cho Seongjae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Doo-Hyun
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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YUN Jang
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Lee Gil
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee J
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Yun Jang‐gn
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Doo‐hyun
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Lee Joung-eob
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Yun Jang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Lee Jong
Inter-univ. Semicon. Res. Center Seoul Nat. Univ.
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Lee Jong
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Jong
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Kim Yoon
School Of Electrical Engineering Seoul National University
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Yur Jang-gn
School Of Electrical Engineering Seoul National University
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Kim Doo-Hyun
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Lee Gil
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
-
Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Park Il
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Lee Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Cho Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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