Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect(Session 2A : Memory 1)
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概要
- 論文の詳細を見る
The retention characteristics in scaled polysilicon-blocking oxide-nitride-tunnel oxide-silicon (SONOS) nonvolatile memory devices have been thoroughly investigated under temperature conditions ranging from room temperature to 180 ℃. Based on precise calculations of the trapped charge quantity and the thermal emission rate, we have evaluated the charge redistribution effect along the vertical direction across a unit device. With 9 nm nitride thickness, 0.8 nm charge centroid migration in 〜10^5 seconds (〜1 day) has been extracted. According to an existing retention model, there are two dominant components of charge decay[1]: one is direct tunneling current through oxide and the other thermal emission. We propose a new component motivating the electron charge movement inside the nitride layer, which can be added to the existing components to obtain a more realistic retention.
- 2010-06-23
著者
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LEE Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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CHO Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Park Byung‐gook
School Of Electrical Engineering Seoul National University
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Lee Gil
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Park Byung-gook
School Of Electrical Engineering Seoul National University
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Lee J
School Of Electrical Engineering Seoul National University
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Cho Seongjae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Doo-Hyun
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Yun Jang-Gn
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoon
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Gil
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Li Dong
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Se
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Lee J
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Yun Jang‐gn
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Park Se
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Doo‐hyun
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Li Dong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Joung-eob
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Wandong
Inter-university Semiconductor Research Center
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Yun Jang-gn
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Yoon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Wandong
Seoul National Univ. Seoul Kor
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Shim Won
Seoul National Univ. Seoul Kor
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Lee Jong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Yun Jang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Byung-gook
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Jong
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Lee Jong
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni
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Kim Yoon
School Of Electrical Engineering Seoul National University
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Yur Jang-gn
School Of Electrical Engineering Seoul National University
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Park Byung-gook
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Park Se
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University
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SHIM Won
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University
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Kim Doo-Hyun
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Li Dong
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Lee Gil
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Shim Won
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
-
Lee Jung
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Cho Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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