Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design

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概要

• 論文の詳細を見る

• In this paper, a compact channel thermal noise model for short-channel MOSFETs is presented and applied to the radio frequency integrated circuit (RFIC) design. Based on the analysis of the relationship among different short-channel effects such as velocity saturation effect (VSE), channel-length modulation (CLM), and carrier heating effect (CHE), the compact model for the channel thermal noise was analytically derived as a simple form. In order to simulate MOSFETs noise characteristics in circuit simulators, an appropriate methodology is proposed. The used compact noise model is verified by comparing simulated results to the measured data at device and circuit level by using 65nm and 130nm CMOS technologies, respectively.

• （社）電子情報通信学会の論文
• 2009-05-01

著者

• PARK Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu

• Park Byung‐gook

  School Of Electrical Engineering Seoul National University

• LEE Jong

  Inter-University Semiconductor Research Center, Seoul National University

• Park Byung-gook

  School Of Electrical Engineering Seoul National University

• Park Byung‐gook

  Seoul National Univ. Seoul Kor

• Lee J

  School Of Electrical Engineering Seoul National University

• Shin Hyungcheol

  Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci

• JEON Jongwook

  Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University

• SONG Ickhyun

  Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University

• Lee J

  Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci

• Song Ickhyun

  School Of Electrical Engineering And Computer Science Seoul National University

• Song Ickhyun

  Inter-university Semiconductor Research Center (isrc):school Of Electrical Engineering Seoul Nationa

• Song Ickhyun

  Dept. Of Eecs Seoul National University

• Lee Joung-eob

  Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci

• Song Ickhyun

  Inter-university Semiconductor Research Center (isrc) And School Of Ee Seoul National University

• Shin Hyungcheol

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu

• Lee Jong

  Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U

• Jeon Jongwook

  Inter-university Semiconductor Research Center (isrc) And School Of Ee Seoul National University

• Lee Jong

  Inter-univ. Semicon. Res. Center Seoul Nat. Univ.

• Park Byung-gook

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat

• Lee Jong

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat

• Lee Jong

  Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul Nat'l Uni

• Shin Hyungcheol

  Inter-university Semiconductor Research Center (isrc)

• Park Byung-gook

  Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U

• Park Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea

• Park Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea

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