Effects of Conductive Defects on Unipolar RRAM for the Improvement of Resistive Switching Characteristics

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概要

• 論文の詳細を見る
• 2012-05-01

著者

• PARK Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu

• Park Byung-gook

  School Of Electrical Engineering Seoul National University

• Park Byung-gook

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat

• Park Byung-gook

  Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U

• Ryoo Kyung-chang

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University

• Oh Jeong-hoon

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University

• Jung Sunghun

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University

• KIM Hyngjin

  Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University

• Kim Hyngjin

  Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University

• Park Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea

• Park Byung-Gook

  Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea

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