Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory
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概要
- 論文の詳細を見る
The 3-dimensional folded NAND array having vertical channels has a large integration density and reliable memory characteristics without short channel effect. But, this kind of 3-D memory with vertical channels experiences inevitable interference between cells on both sides of a single silicon pillar, which is called PCI (Paired Cell Interference). As the thickness of silicon fin is scaled down, this phenomenon becomes severer. Consequently, the PCI is a crucial scaling restriction factor of vertical type flash memory. In this paper, we propose a multi-level reading method which utilizes PCI.
- 社団法人電子情報通信学会の論文
- 2009-06-17
著者
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CHO Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Park Byung‐gook
School Of Electrical Engineering Seoul National University
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Lee Gil
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Park Byung-gook
School Of Electrical Engineering Seoul National University
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Park Byung‐gook
Seoul National Univ. Seoul Kor
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Park Il
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Il
Inter-university Semiconductor Research Center Seoul National University:school Of Electrical Engine
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Cho Seongjae
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Doo-Hyun
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Yun Jang-Gn
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Lee Gil
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Li Dong
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Park Se
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National
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Yun Jang‐gn
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Park Se
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Doo‐hyun
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Yoon
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Li Dong
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Kim Wandong
Inter-university Semiconductor Research Center
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Shim Wonbo
Inter-university Semiconductor Research Center
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Yun Jang-gn
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Yoon
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Il
Inter-university Semiconductor Research Center And School Of Electrical Engineering And Computer Sci
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Kim Wandong
Seoul National Univ. Seoul Kor
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Shim Won
Seoul National Univ. Seoul Kor
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Yun Jang
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Park Byung-gook
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering Seoul Nat
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Kim Yoon
School Of Electrical Engineering Seoul National University
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Yur Jang-gn
School Of Electrical Engineering Seoul National University
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Park Byung-gook
Inter-university Semiconductor Research Center And School Of Electrical Engineering Seoul National U
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Park Se
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University
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Kim Doo-Hyun
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Li Dong
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
-
Lee Gil
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
-
Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Park Il
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
-
Cho Seongjae
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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