Song Ickhyun | School Of Electrical Engineering And Computer Science Seoul National University
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関連著者
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Song Ickhyun
School Of Electrical Engineering And Computer Science Seoul National University
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SONG Ickhyun
Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University
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Song Ickhyun
Inter-university Semiconductor Research Center (isrc):school Of Electrical Engineering Seoul Nationa
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Song Ickhyun
Dept. Of Eecs Seoul National University
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Shin Hyungcheol
School Of Electrical Engineering And Computer Science Seoul National University
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Shin Hyungcheol
Dept. Of Eecs Seoul National University
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Jhon Hee-sauk
School Of Electrical Engineering And Computer Science Seoul National University
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Shin Hyungcheol
Dept. Of Eecs Kaist
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Shin Hyungcheol
Inter-University Semiconductor Research Center and School of Electrical Engineering and Computer Sci
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JEON Jongwook
Inter-University Semiconductor Research Center (ISRC) and School of EE, Seoul National University
著作論文
- 24GHz Low Noise Amplifier Design in 65nm CMOS Technology with Inter-Stage Matching Optimization(Session8B: High-Frequency, Photonic and Sensing Devices)
- Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design
- Low cost CMOS LNA design using thin-metal CMOS process (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Low cost CMOS LNA design using thin-metal CMOS process (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- 24GHz Low Noise Amplifier Design in 65nm CMOS Technology with Inter-Stage Matching Optimization(Session8B: High-Frequency, Photonic and Sensing Devices)
- Implementation of Channel Thermal Noise Model in CMOS RFIC Design(Session8A: Si Devices III)
- Implementation of Channel Thermal Noise Model in CMOS RFIC Design(Session8A: Si Devices III)
- CMOS low-noise amplifer with noise suppression technique from gate resistance (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- CMOS low-noise amplifer with noise suppression technique from gate resistance (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Characterization of Sensitivity and Resolution of Silicon Resistive Probe