Lee Jong | School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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概要
- Lee Jong Dukの詳細を見る
- 同名の論文著者
- School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Koreaの論文著者
関連著者
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Lee Jong
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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Shin Hyungcheol
School Of Electrical Engineering And Computer Science Seoul National University
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Park Byung-Gook
School of Electrical Engineering & Inter-University Semiconductor Research Center (ISRC), Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Republic of Korea
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Lee Jong
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Shin Hyungcheol
School of Electrical Eng.
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Park Byung-Gook
School of EECS and ISRC, Seoul National University, Seoul 151-742, Korea
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Song Ickhyun
School Of Electrical Engineering And Computer Science Seoul National University
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Kang Daewoong
School Of Electrical Engineering Seoul National University
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Shin Hyungcheol
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Min Dong-Ki
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
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Park Byung-Gook
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Park Byung-Gook
School of Electrical Engineering and Computer Science, Seoul National University, San 56-1, Shinlim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Kim Jinho
CIS PA, LSI Division, Samsung Electronics Co., Ltd., San #24, Nongseo-dong, Giheung-gu, Yongin, Gyeonggi, 449-711, Korea
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Lee Duckhyung
CIS PA, LSI Division, Samsung Electronics Co., Ltd., San #24, Nongseo-dong, Giheung-gu, Yongin, Gyeonggi, 449-711, Korea
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Kim Junsoo
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Lee Jaehong
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Kang Daewoong
School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Hong Seungbum
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
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Ko Hyoungsoo
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
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Park Hongsik
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
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Park Chulmin
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
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Jung Juhwan
Semiconductor Device and Material Laboratory, Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-ri, Kiheung-eup, Yongin, Gyunggi 449-712, Korea
著作論文
- Extraction of Vertical, Lateral Locations and Energies of Hot-Electrons-Induced Traps through the Random Telegraph Noise
- Characterization of Sensitivity and Resolution of Silicon Resistive Probe