Nishimura Tadashi | Ulsi Research And Development Center Mitsubishi Electric Corporation
スポンサーリンク
概要
関連著者
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Nishimura Tadashi
The Ulsi Development Center Mitsubishi Electric Corporation
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Nishimura Tadashi
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Ogawa Y
Riken Wako‐shi Jpn
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Ogawa Yasutaka
Division Of Electronics And Information Engineering Faculty Of Engineering Hokkaido University
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NISHIMURA Toshihiko
Graduate School of Engineering, Hokkaido University
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OHGANE Takeo
Graduate School of Engineering, Hokkaido University
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OGAWA Yasutaka
Graduate School of Engineering, Hokkaido University
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Ohgane Takeo
Graduate School Of Engineering Hokkaido University
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Ogawa Yasutaka
Graduate School Of Engineering Hokkaido University
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NISHIMURA Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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YAMAGUCHI Yasuo
Institute for Materials Research, Tohoku University
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Yamaguchi Y
Tohoku Univ. Sendai
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Yamaguchi Y
Kumamoto Techno Res. Park Kumamoto Jpn
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Yamaguchi Y
Central Workshop Osaka University
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YAMAGUCHI Yasuo
ULSI Laboratory, Mitsubishi Electric Corporation
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IWAMATSU Toshiaki
ULSI Laboratory, Mitsubishi Electric Corporation
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INOUE Yasuo
ULSI Development Center, Mitsubishi Electric Corporation
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IWAMATSU Toshiaki
Advanced Device Development Dept., Renesas Technology Corp.
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Inoue Y
National Defense Acad. Yokosuka Jpn
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Iwamatsu Toshiaki
Advanced Device Development Dept. Renesas Technology Corp.
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Inoue Y
Ntt Access Network Service Systems Laboratories Ntt Corporation
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NISHIMOTO Hiroshi
Graduate School of Information Science and Technology, Hokkaido University
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Maegawa Shigeto
Advanced Device Development Dept. Renesas Technology Corp.
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MAEGAWA Shigeto
ULSI Laboratory, Mitsubishi Electric Corporation
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Maegawa Shigeto
Ulsi Development Center Mitsubishi Electric Corporation
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TAKANASHI Masaki
Graduate School of Information Science and Technology, Hokkaido University
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INUISHI Masahide
ULSI Laboratory, Mitsubishi Electric Corporation
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Horino Y
Advanced Device Development Dept. Renesas Technology Corp.
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IPPOSHI Takashi
Advanced Device Development Dept., Renesas Technology Corp.
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INUISHI Masahide
Advanced Device Development Dept., Renesas Technology Corp.
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Takai M
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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UCHIDA Tetsuya
ULSI Laboratory, Mitsubishi Electric Corporation
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Horiba Yasutaka
System Lsi Laboratory Mitsubishi Electric Corporation
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Ipposhi Takashi
Advanced Device Development Dept. Renesas Technology Corp.
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Ishikawa K
Mitsubishi Electric Corp. Itami‐shi Jpn
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Eikyu K
Mitsubishi Electric Corp. Hyogo Jpn
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Ipposhi T
Advanced Device Development Dept. Renesas Technology Corp.
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BUI Huu
Graduate School of Information Science and Technology, Hokkaido University
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MORISHITA Fukashi
Renesas Technology Corp.
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Tanabe Y
Sanyo Electric Co. Ltd.
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Hirao T
Advanced Device Development Dept. Renesas Technology Corp.
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NISHIMURA Tadashi
the ULSI Development Center, Mitsubishi Electric Corporation
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TAKAI Mikio
Research Center for Materials Science at Extreme Conditions, Osaka University
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IPPOSHI Takashi
ULSI Development Center, Mitsubishi Electric Corporation
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MORISHITA Fukashi
ULSI Development Center, Mitsubishi Electric Corporation
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EIMORI Takahisa
ULSI Development Center, Mitsubishi Electric Corporation
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OASHI Toshiyuki
ULSI Development Center, Mitsubishi Electric Corporation
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ARIMOTO Kazutami
ULSI Development Center, Mitsubishi Electric Corporation
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TSUBOUCHI Natsuro
ULSI Laboratory, Mitsubishi Electric Corporation
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YASUOKA Akihiko
ULSI Laboratory, Mitsubishi Electric Corporation
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MIYOSHI Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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Ueda K
Mitsubishi Electric Corp. Itami‐shi Jpn
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Ueda Kimio
System Lsi Development Center Mitsubishi Electric Corp.
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KUROI Takashi
ULSI Development Center, Mitsubishi Electric Corporation
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TERAMOTO Akinobu
ULSI Development Center, Mitsubishi Electric Corporation
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DOI Yoshiharu
SANYO Electric Co., Ltd.
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OGAWA Yasutaka
The Graduate School of Engineering, Hokkaido University
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OHGANE Takeo
The Graduate School of Engineering, Hokkaido University
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Kitakado Jun
Sanyo Electric Co Ltd
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Eimori T
Mitsubishi Electric Corp. Hyogo Jpn
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Eimori Takahisa
Ulsi Development Center Mitsubishi Electric Corporation
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Ohno Y
Nagoya Univ. Naogya Jpn
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Ohno Yoshikazu
Ulsi Laboratory Mitsubishi Electric Corporation
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SAYAMA Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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KINOMURA Atsushi
National Institute of Advanced Industrial Science and Technology
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Ueda K
System Lsi Laboratory Mitsubishi Electric Corporation
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SHIMIZU Satoshi
ULSI Laboratory, Mitsubishi Electric Corporation
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EIKYU Katsumi
ULSI Development Center, Mitsubishi Electric Corporation
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Yasuoka Akihiko
Ulsi Laboratory Mitsubishi Electric Corporation
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Teramoto Akinobu
Ulsi Development Center Mitsubishi Electric Corporation
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Teramoto Akinobu
Ulsi Laboratory Mitsubishi Electric Corporation
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Teramoto Akinobu
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Miyoshi Hirokazu
Ulsi Laboratory Mitsubishi Electric Corporation
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Mashiko Koichiro
The Ulsi Development Center Mitsubishi Electric Corporation
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Mashiko Koichiro
System Lsi Development Center Mitsubishi Electric Corporation
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Mashiko Koichiro
System Lsi Laboratory Mitsubishi Electric Corporation
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Hoshino Masayuki
Panasonic Mobile Communications Co. Ltd.
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Hoshino Masayuki
Department Of Electronic Engineering The University Of Electro-communications:(present Address)japan
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Tsubouchi Natsuro
Lsi Research And Development Laboratory Mitusbishi Electric Corporation
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Tsubouchi Natsuro
Ulsi Development Center Mitsubishi Electric Corporation
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TSUKUDA Eiji
ULSI Research and Development Center, Mitsubishi Electric Corporation
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FUJINAGA Masato
ULSI Research and Development Center, Mitsubishi Electric Corporation
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KUNIKIYO Tatsuya
ULSI Research and Development Center, Mitsubishi Electric Corporation
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ISHIKAWA Kiyoshi
ULSI Research and Development Center, Mitsubishi Electric Corporation
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KAWAZU Satoru
Department of Electronics and Photonic Systems Engineering, Kochi University of Technology
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Uesugi M
Panasonic Mobile Communications Co. Ltd. Yokosuka‐shi Jpn
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Ueda K
Ntt Atsugi‐shi Jpn
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Tsukuda E
Kyowa Hakko Kogyo Co. Ltd. Shizuoka Jpn
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Tsukuda Eiji
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Kawazu S
Department Of Electronics And Photonic Systems Engineering Kochi University Of Technology
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Eikyu Katsumi
Ulsi Development Center Mitsubishi Electric Corporation
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Doi Yoshiharu
Sanyo Electric Co. Ltd.
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Kuroi T
Ulsi Development Center Mitsubishi Electric Corporation
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Kuroi Takashi
Ulsi Development Center Mitsubishi Electric Corporation
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Ueda Katsuhiko
Department Of Information Engineering Nara National College Of Technology
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Oashi Toshiyuki
Ulsi Development Center Mitsubishi Electric Corporation
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Sayama Hirokazu
Ulsi Development Center Mitsubishi Electric Corporation
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UESUGI Mitsuru
Panasonic Mobile Communications Co , Ltd
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NISHIMURA Toshihiko
The Graduate School of Engineering, Hokkaido University
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KAMBARA Keiichi
Graduate School of Information Science and Technology, Hokkaido University
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Kambara Keiichi
Graduate School Of Information Science And Technology Hokkaido University
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Kishimoto T
Department Of Physics Osaka University
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Kishimoto T
Department Of Electrical Engineering Waseda University
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Miyoshi H
Mitsubishi Electric Corp.
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KUBO Hiroshi
Information Technology R&D Center, Mitsubishi Electric Corporation
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Park Y‐k
Samsung Electronics Gyeonggi‐do Kor
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Horino Y
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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YAMAGUCHI Yasuo
the ULSI Development Center, Mitsubishi Electric Corporation
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IPPOSHI Takashi
the ULSI Development Center, Mitsubishi Electric Corporation
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UEDA Kimio
the ULSI Development Center, Mitsubishi Electric Corporation
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MASHIKO Koichiro
the ULSI Development Center, Mitsubishi Electric Corporation
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MAEGAWA Shigeto
the ULSI Development Center, Mitsubishi Electric Corporation
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INUISHI Masahide
the ULSI Development Center, Mitsubishi Electric Corporation
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NAKAYAMA Kouichi
Research Center for Materials Science at Extreme Conditions, Osaka University
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TAKAOKA Hiromichi
Research Center for Materials Science at Extreme Conditions, Osaka University
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KINOMURA Atsushi
ONRI, AIST
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HORINO Yuji
ONRI, AIST
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UEDA Kimio
System LSI Development Center, Mitsubishi Electric Corporation
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MAEDA Shigenobu
ULSI Development Center, Mitsubishi Electric Corporation
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MASHIKO Koichiro
System LSI Development Center, Mitsubishi Electric Corporation
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HIRANO Yuuichi
ULSI Development Center, Mitsubishi Electric Corporation
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FERNANDEZ Warren
ULSI Development Center, Mitsubishi Electric Corporation
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YAMADA Michihiro
ULSI Development Center, Mitsubishi Electric Corporation
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IMAI Yukari
ULSI Laboratory, Mitsubishi Electric Corporation
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HIRAO Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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MIYAMOTO Shouichi
ULSI Laboratory, Mitsubishi Electric Corporation
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SUMA Katsuhiro
Semiconductor Group, Mitsubishi Electric Corporation
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TSURUDA Takahiro
ULSI Laboratory, Mitsubishi Electric Corporation
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HIROSE Masakazu
Daioh Electric Corporation
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HIDAKA Hideto
ULSI Laboratory, Mitsubishi Electric Corporation
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FUJISHIMA Kazuyasu
Semiconductor Group, Mitsubishi Electric Corporation
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JOACHIM Hans-Oliver
ULSI Laboratory, Mitsubishi Electric Corporation
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Takahashi Jun
ULSI Laboratory, Mitsubishi Electric Corporation
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Yamaguchi Takehisa
ULSI Laboratory, Mitsubishi Electric Corporation
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Wada Tomohisa
ULSI Laboratory, Mitsubishi Electric Corporation
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Imai Y
National Inst. Materials And Chemical Res. Ibaraki Jpn
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Joachim Hans-oliver
Ulsi Laboratory Mitsubishi Electric Corporation
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Phu Bui
Graduate School Of Information Science And Technology Hokkaido University
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TANABE Yasuhiko
Graduate School of Engineering, Hokkaido University
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DOI Yoshiharu
Hypermedia Research Center, SANYO Electric Co., Ltd.
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KITAKADO Jun
Hypermedia Research Center, SANYO Electric Co., Ltd.
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FUJISHIMA Kenzaburoh
Division of Electronics and Information Engineering, Graduate School of Engineering, Hokkaido Univer
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TANABE Yasuhiko
Division of Electronics and Information Engineering, Graduate School of Engineering, Hokkaido Univer
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NISHIMURA Toshihiko
Division of Electronics and Information Engineering, Graduate School of Engineering, Hokkaido Univer
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OGAWA Yasutaka
Division of Electronics and Information Engineering, Graduate School of Engineering, Hokkaido Univer
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OHGANE Takeo
Division of Electronics and Information Engineering, Graduate School of Engineering, Hokkaido Univer
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TAKAI Mikio
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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HORIBA Yasutaka
The authors are with Kita-Itami Works, Mitsubishi Electric Corporation
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KISHIMOTO Takehisa
Research Center for Materials Science at Extreme Conditions and Faculty of Engineering Science, Osak
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KISHIMOTO Takehisa
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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PARK Yang-Keun
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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SONODA Kenichirou
ULSI Laboratory, Mitsubishi Electric Corporation
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KINOMURA Atsushi
Osaka National Research Institute, AIST
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HORINO Yuji
Osaka National Research Institute, AIST
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FUJII Kanenaga
Osaka National Research Institute, AIST
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Hamaguchi Chihiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Hamaguchi Chihiro
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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Hamaguchi Chihiro
Department Of Electronic Engineering Osaka University
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HORINO Yuji
National Institute of Advanced Industrial Science and Technology
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Imai Yukari
Ulsi Laboratory Mitsubishi Electric Corporation
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Nakayama Kazuhiko
Mechanical Processing Technology Research Laboratories Kao Corporation
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FURUKAWA Akihiko
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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HIRANO Yoichi
National Institute of Advanced Industrial Science and Technology (AIST)
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Nishida Yukio
Ulsi Development Center Mitsubishi Electric Corporation
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Nishida Yukio
Ulsi Laboratory Mitsubishi Electric Corporation
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SHIRAHATA Masayoshi
ULSI Development Center, Mitsubishi Electric Corporation
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Horiba Yasutaka
Lsi Laboratory Mitsubishi Electric Corporation
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Horiba Yasutaka
The Authors Are With Kita-itami Works Mitsubishi Electric Corporation
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Maeda Shigenobu
Ulsi Development Center Mitsubishi Electric Corporation
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Miyamoto Shouichi
Ulsi Laboratory Mitsubishi Electric Corporation
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Okumura Yoshihiro
Research Institute Of Electronics Shizuoka University
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Yamashita Tomohiro
Ulsi Development Center Mitsubishi Electric Corporation
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Yamashita Tomohiro
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Yamaguchi Yasuo
The Ulsi Development Center Mitsubishi Electric Corporation
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KOTANl Norihiko
ULSI Research and Development Center, Mitsubishi Electric Corporation
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OKUMURA Yoshinori
ULSI Laboratory, Mitsubishi Electric Corporation
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Nishimura T
Advanced Technology R&d Center Mitsubishi Electric Corporation
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EIKYU Katsumi
the ULSI Development Center, Mitsubishi Electric Corporation
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SAKAKIBARA Kiyohiko
the System LSI Division, Mitsubishi Electric Corporation
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ISHIKAWA Kiyoshi
the ULSI Development Center, Mitsubishi Electric Corporation
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SONODA Kenichiro
ULSI Development Center,Mitsubishi Electric Corporation
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KAWAZU Satoru
the Department of Electronic and Photonic Systems Engineering, Kochi University of Technology
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IZUMI Yoshitaka
NHK Science and Technical Research Laboratories
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Wada T
System Lsi Development Center Mitsubishi Electric Corporation
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Hirano Y
Advanced Device Development Dept. Renesas Technology Corp.
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Nakayama K
National Inst. Advanced Industrial Technol. And Sci. Ibaraki Jpn
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Hidaka H
Yrp Mobil Telecommunications Key Technol. Res. Lab. Co. Ltd. Yokosuka‐shi Jpn
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Hidaka Hideto
Ulsi Laboratory Mitsubishi Electric Corporation
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Wada Tomohisa
Ulsi Laboratory Mitsubishi Electric Corporation
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Sayama H
Mitsubishi Electric Corp. Hyogo Jpn
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Sayama Hirokazu
Ulsi Laboratory Mitsubishi Electric Corporation
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DOI Yoshiharu
The Hypermedia Research Center, SANYO Electric Co., Ltd.
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KITAKADO Jun
The Hypermedia Research Center, SANYO Electric Co., Ltd.
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Fujishima K
Mitsubishi Electric Co. Itami‐shi Jpn
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HIGASHINAKA Masatsugu
Information Technology R&D Center, Mitsubishi Electric Corporation
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OKAZAKI Akihiro
Mitsubishi Electric ITE-TCL
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BUI Huu-Phu
Graduate School of Information Science and Technology, Hokkaido University
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NISHIO Keisuke
the Graduate School of Information Science and Technology, Hokkaido University
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Nishio Keisuke
The Graduate School Of Information Science And Technology Hokkaido University
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Okumura Y
Minolta Co. Ltd. Osaka Jpn
著作論文
- Channel Characteristics and Performance of MIMO E-SDM Systems in an Indoor Time-Varying Fading Environment
- Partially Depleted SOI Technology with Body-Tied Hybrid Trench Isolation for High-Speed System-On-a-Chip Application(Special Issue on Integrated Systems with New Concepts)
- Direct Measurement of Transient Drain Currents in Partially-Depleted SOI N-Channel MOSFETs Using a Nuclear Microprobe for Highly Reliable Device Designs
- Analyses of the Radiation-Caused Characteristics Change in SOI MOSFETs Using Field Shield Isolation
- Analysis and Optimization of Floating Body Cell Operation for High-Speed SOI-DRAM (Special Issue on Ultra-High-Speed IC and LSI Technology)
- The Influence of the Buried Oxide Defects on the Gate Oxide Reliability and Drain Leakage Currents of the Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
- Analysis of the Delay Distributions of 0.5μm SOI LSIs (Special Issue on SOI Devices and Their Process Technologies)
- Features of SOI DRAM's and their Potential for Low-Voltage and/or Giga-Bit Scale DRAM's (Special Issue on ULSI Memory Technology)
- Low-Voltage Operation of a High-Resistivity Load SOI SRAM Cell by Reduced Back-Gate-Bias Effect
- A Spatial Domain Interference Canceller Using a Multistage Adaptive Array with Precise Timing Estimation (Special Issue on Adaptive Array Antenna Techniques for Advanced Wireless Communications)
- Combining Techniques for Spatial-Domain Path-Diversity Using an Adaptive Array
- Control of Carrier Collection Efficiency in n^+p Diode with Retrograde Well and Epitaxial Layers
- Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Random Access Memories (DRAMs)
- High performance 0.2μm Dual Gate Complementary MOS Technologies by Suppression of Transient-Enhanced-Diffusion using Rapid Thermal Annealing
- Simulation of Dopant Redistribution During Gate Oxidation Including Transient-Enhanced Diffusion Caused by Implantation Damage
- 2-Dimensional Simulation of FN Current Suppression Including Phonon Assisted Tunneling Model in Silicon Dioxide
- 3-D Topography and Impurity Integrated Process Simulator (3-D MIPS) and Its Applications (Special Issue on TCAD for Semiconductor Industries)
- A Study on an Antenna Selection Scheme for Space-Time Turbo Code for OFDM Systems(Software Defined Radio Technology and Its Applications)
- A Study on an Antenna Selection Scheme for Space-Time Turbo Code for OFDM Systems
- Space Domain Multistage Interference Canceller for SDMA(Special Issue on Innovative Mobile Communication Technologies at the Dawn of the 21^Century)
- Performance Evaluation of MIMO-UWB Systems Using Measured Propagation Data and Proposal of Timing Control Scheme in LOS Environments
- Performance Evaluation of Multiuser MIMO E-SDM Systems in Time-Varying Fading Environments
- Subblock Processing for Frequency-Domain Turbo Equalization under Fast Fading Environments
- Precise DOA Estimation Using SAGE Algorithm with a Cylindrical Array
- Soft Decision Directed Channel Estimation with Interference Cancellation for a MIMO System Using Iterative Equalization and Decoding
- Performance of MIMO E-SDM Systems Using Channel Prediction in Actual Time-Varying Indoor Fading Environments
- Measurement-Based Performance Evaluation of Coded MIMO-OFDM Spatial Multiplexing with MMSE Spatial Filtering in an Indoor Line-of-Sight Environment
- Studies on an Iterative Frequency Domain Channel Estimation Technique for MIMO-UWB Communications
- Subblock processing in MMSE-FDE under fast fading environments
- Measurement-Based Performance Evaluation of MIMO Spatial Multiplexing in a Multipath-Rich Indoor Environment
- Arrangement of Scattering Points in Jakes' Model for i.i.d. Time-Varying MIMO Fading
- Pseudo Eigenbeam-Space Division Multiplexing (PE-SDM) in Frequency-Selective MIMO Channels
- MIMO E-SDM Transmission Performance in an Actual Indoor Environment
- Channel Extrapolation Techniques for E-SDM System in Time-Varying Fading Environments(Wireless Communication Technologies)
- B-5-76 Channel Prediction for an E-SDM System in Time-Varying Fading Environments
- B-5-24 Compensation of Time-variant Fading Channel Error for E-SDM in a TDD System
- Direction-of-Arrival Estimation of Coherent Signals Using a Cylindrical Array(Antennas and Propagation)
- Applications of Space Division Multiplexing and Those Performance in a MIMO Channel(Recent Progress in Antennas and Propagation Researches : Selected Papers Translated from the IEICE Transactions on Communications (Japanese Edition))
- Channel Estimation and Signal Detection for Space Division Multiplexing in a MIMO-OFDM System(MIMO)(Multi-carrier Signal Processing Techniques for Next Generation Mobile Communications-Part 1)
- The Effects on Metal Oxide Semiconductor Field Effect Transistor Properties of Nitrogen Implantation into p^+ Polysilicon Gate
- Performance Evaluation of a Multi-User MIMO System With Prediction of Time-Varying Indoor Channels