Sayama H | Mitsubishi Electric Corp. Hyogo Jpn
スポンサーリンク
概要
関連著者
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TAKAI Mikio
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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Ohno Y
Nagoya Univ. Naogya Jpn
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Sayama H
Mitsubishi Electric Corp. Hyogo Jpn
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Takai Mikio
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Ohno Yoshikazu
Ulsi Laboratory Mitsubishi Electric Corporation
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SAYAMA Hirokazu
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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Sayama Hirokazu
Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University
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Sonoda K
Ulsi Development Center Mitsubishi Electric Corporation
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NISHIMURA Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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SONODA Kenichirou
ULSI Laboratory, Mitsubishi Electric Corporation
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Satoh Shin-ichi
ULSI Laboratory, Mitsubishi Electric Corporation
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Satoh S
Mitsubishi Electric Corp. Hyogo Jpn
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Nishimura Tadashi
The Ulsi Development Center Mitsubishi Electric Corporation
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Kimura H
Molecular Neuroscience Research Center Shiga University Of Medical Science
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Kimura Hiroshi
Molecular Neuroscience Research Center Shiga University Of Medical Science
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Nishimura Tadashi
Ulsi Development Center Mitsubishi Electric Corporation
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Horino Y
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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KISHIMOTO Takehisa
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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KINOMURA Atsushi
Osaka National Research Institute, AIST
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HORINO Yuji
Osaka National Research Institute, AIST
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FUJII Kanenaga
Osaka National Research Institute, AIST
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Kimura Hiroshi
ULSI Laboratory, Mitsubishi Electric Corporation
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Hara Shigenori
Faculty of Engineering Science and Research Center for Extreme Materials
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Hara S
Osaka Univ. Suita‐shi Jpn
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Hara S
The Department Of Electronic Information And Energy Engineering Graduate School Of Engineering Osaka
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HORINO Yuji
National Institute of Advanced Industrial Science and Technology
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KINOMURA Atsushi
National Institute of Advanced Industrial Science and Technology
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Hara Shinsuke
The Faculty Of Engineering Osaka University
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Horiba Yasutaka
System Lsi Laboratory Mitsubishi Electric Corporation
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Hara Shinsuke
The Graduate School Of Engineering Osaka University
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Kishimoto T
Department Of Physics Osaka University
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Kishimoto T
Department Of Electrical Engineering Waseda University
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Horino Yuji
National Inst. Of Advanced Industrial Sci. And Technol. Kansai Osaka Jpn
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Kinomura A
National Institute Of Advanced Industrial Science And Technology
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Park Y‐k
Samsung Electronics Gyeonggi‐do Kor
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MIYOSHI Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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Horino Y
Advanced Device Development Dept. Renesas Technology Corp.
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Takai M
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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PARK Yang-Keun
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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SAYAMA Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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SATOH Shinichi
ULSI Laboratory, Mitsubishi Electric Corporation
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Sonoda Ken-ichiro
ULSI Laboratory, Mitsubishi Electric Corporation
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KOTANI Norihiko
ULSI Laboratory, Mitsubishi Electric Corporation
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KIMURA Hiroshi
LSI Research and Development Laboratory, Mitsubishi Electric Corporation
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OHNO Yoshikazu
LSI Research and Development Laboratory, Mitsubishi Electric Corporation
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SATOH Shinichi
LSI Research and Development Laboratory, Mitsubishi Electric Corporation
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Satoh Shin-ichi
Ulsi Laboratory Mitsubishi Electric Corporation
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Miyoshi Hirokazu
Ulsi Laboratory Mitsubishi Electric Corporation
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Nishimura Tadashi
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Sayama Hirokazu
Ulsi Development Center Mitsubishi Electric Corporation
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Miyoshi H
Mitsubishi Electric Corp.
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Miyoshi Hirokazu
徳島大学医学部
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Kotani N
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Kotani Norihiko
Ulsi Laboratory Mitsubishi Electric Corporation
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Satoh Shinichi
Lsi Research & Development Lab.
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Takai Mikio
Faculty Of Engineering Science And Reseatch Center For Extreme Materials
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Kotani Norihiko
ULSI Development Center, Mitsubishi Electric Corporation
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Sonoda Ken-ichiro
ULSI Development Center, Mitsubishi Electric Corporation
著作論文
- Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Random Access Memories (DRAMs)
- Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction
- Soft-Error Study of DRAMs with Retrograde Well Structure by New Evaluation Method (Special Issue on Quarter Micron Si Device and Process Technologies)
- Charge Collection Control Using Retrograde Well Tested by Proton Microprobe Irradiation
- New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe