Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-12-30
著者
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Horino Y
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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NISHIMURA Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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TAKAI Mikio
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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Ohno Y
Nagoya Univ. Naogya Jpn
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Ohno Yoshikazu
Ulsi Laboratory Mitsubishi Electric Corporation
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KISHIMOTO Takehisa
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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SONODA Kenichirou
ULSI Laboratory, Mitsubishi Electric Corporation
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KINOMURA Atsushi
Osaka National Research Institute, AIST
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HORINO Yuji
Osaka National Research Institute, AIST
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FUJII Kanenaga
Osaka National Research Institute, AIST
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SAYAMA Hirokazu
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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HORINO Yuji
National Institute of Advanced Industrial Science and Technology
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KINOMURA Atsushi
National Institute of Advanced Industrial Science and Technology
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Horiba Yasutaka
System Lsi Laboratory Mitsubishi Electric Corporation
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Nishimura Tadashi
The Ulsi Development Center Mitsubishi Electric Corporation
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Sayama H
Mitsubishi Electric Corp. Hyogo Jpn
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Sayama Hirokazu
Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University
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Kishimoto T
Department Of Physics Osaka University
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Kishimoto T
Department Of Electrical Engineering Waseda University
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Horino Yuji
National Inst. Of Advanced Industrial Sci. And Technol. Kansai Osaka Jpn
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Takai Mikio
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Kinomura A
National Institute Of Advanced Industrial Science And Technology
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Sonoda K
Ulsi Development Center Mitsubishi Electric Corporation
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Nishimura Tadashi
Ulsi Development Center Mitsubishi Electric Corporation
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