Damage during Microchanneling Analysis Using 400 keV Helium Ion Microprobe
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-05-15
著者
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Namba Susumu
Faculty Of Engineering Science Osaka University
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Namba Susumu
Nagasaki Institute Of Applied Science
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TAKAI Mikio
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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KINOMURA Atsushi
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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Hirai Koichi
Yakult Institute For Microbiological Research
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HIRAI Kouichi
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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Hirai Kouichi
Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University
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Takai Mikio
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Kinomura Atsushi
Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University:(present A
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Namba Susumu
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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TAKAI Mikio
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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NAMBA Susumu
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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