Change in Scanning Tunneling Microscope (STM) Tip Shape during Nanofabrication
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概要
- 論文の詳細を見る
The influence of voltage pulses upon scanning tunneling microscope (STM) tips during nanofabrication has been studied. The tips were observed by scanning electron microscopy (SEM) before and after application of voltage pulses with various pulse amplitudes, pulse widths and tunneling gap widths, and were found to be damaged by highly concentrated current flowing through the tunneling gap, which resulted in melt and/or evaporation oftips.
- 社団法人応用物理学会の論文
- 1993-01-15
著者
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YOKOI Naoki
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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Takai Mikio
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Namba Susumu
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Ueda Satoshi
Faculty Of Pharmaceutical Sciences Tokushima Bunri University
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Ueda Satoshi
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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