New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1992-12-30

著者

• TAKAI Mikio

  Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University

• Ohno Y

  Nagoya Univ. Naogya Jpn

• SAYAMA Hirokazu

  Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University

• Satoh Shin-ichi

  ULSI Laboratory, Mitsubishi Electric Corporation

• Hara Shigenori

  Faculty of Engineering Science and Research Center for Extreme Materials

• KIMURA Hiroshi

  LSI Research and Development Laboratory, Mitsubishi Electric Corporation

• OHNO Yoshikazu

  LSI Research and Development Laboratory, Mitsubishi Electric Corporation

• SATOH Shinichi

  LSI Research and Development Laboratory, Mitsubishi Electric Corporation

• Hara S

  Osaka Univ. Suita‐shi Jpn

• Hara S

  The Department Of Electronic Information And Energy Engineering Graduate School Of Engineering Osaka

• Hara Shinsuke

  The Faculty Of Engineering Osaka University

• Satoh S

  Mitsubishi Electric Corp. Hyogo Jpn

• Hara Shinsuke

  The Graduate School Of Engineering Osaka University

• Kimura H

  Molecular Neuroscience Research Center Shiga University Of Medical Science

• Sayama H

  Mitsubishi Electric Corp. Hyogo Jpn

• Sayama Hirokazu

  Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University

• Kimura Hiroshi

  Molecular Neuroscience Research Center Shiga University Of Medical Science

• Takai Mikio

  Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University

• Satoh Shinichi

  Lsi Research & Development Lab.

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