Kishimoto T | Department Of Electrical Engineering Waseda University
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概要
関連著者
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Kishimoto T
Department Of Electrical Engineering Waseda University
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Kishimoto T
Department Of Physics Osaka University
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Takai M
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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Takai Mikio
Faculty Of Engineering Science And Reseatch Center For Extreme Materials
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TAKAI Mikio
Research Center for Materials Science at Extreme Conditions, Osaka University
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Takai Mikio
Research Center For Environmental Genomics Kobe University
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Enomoto Hiroyuki
Department of Neurology, National Douhoku Hospital
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Enomoto Hiroyuki
Department Of Materials Science Osaka Electro-communication University
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Shin J
Department Of Physics Taejon University
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Shin Jae
Department Of Transport Vehicle Engineering Gyeongsang National University
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Enomoto H
Hitachi Device Dev. Center Tokyo Jpn
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Ohno Y
Nagoya Univ. Naogya Jpn
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SHIN Jae
New Drug Research Laboratories, Chong Kun Dang Research Institute
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OZAKI Hajime
Department of Electrical, Electronics and Computer Engineering, Waseda University
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KISHIMOTO Takeshi
Department of Electrical Engineering, Waseda University
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Ozaki H
Department Of Electrical Electronics And Computer Engineering Waseda University
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Shin J
New Drug Research Laboratories Chong Kun Dang Research Institute
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Shin Jae
Department Of Ophthalmology School Of Medicine Kyungpook National University
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Ozaki Hajime
Department Of Electrical Electronics And Computer Engineering Waseda University
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Enomoto Hiroyuki
Department Of Applied Chemistry Faculty Of Engineering Osaka Electro-communication University
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Shin Jae
Department Of Chemistry Chungbuk National University
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Shin Jae
Department of Chemical Engineering, Dongguk University
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Takano Yasushi
Department Of Electrical And Electronic Engineering Toyohashi University Of Technology
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Park Y‐k
Samsung Electronics Gyeonggi‐do Kor
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NISHIMURA Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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Takagi Yuji
Information And Communications Research Center Matsushita Electric Industrial Co. Ltd.
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Ohno Yoshikazu
Ulsi Laboratory Mitsubishi Electric Corporation
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KISHIMOTO Takehisa
Research Center for Materials Science at Extreme Conditions and Faculty of Engineering Science, Osak
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TAKANO Yoshiki
Department of Physics, College of Science and Technology, Nihon University
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Nishimura Tadashi
The Ulsi Development Center Mitsubishi Electric Corporation
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Mori N
Univ. Tokyo Tokyo Jpn
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Takano Yoshiki
Department Of Electrical Engineering Waseda University
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Nishimura Tadashi
Ulsi Development Center Mitsubishi Electric Corporation
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Horino Y
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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KISHIMOTO Tadafumi
Department of Physics,Osaka university
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AWAJI Naoki
Fujitsu Laboratories Ltd.
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TAKAI Mikio
Faculty of Engineering Science, and Research Center for Extreme Materials, Osaka University
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KISHIMOTO Takehisa
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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SONODA Kenichirou
ULSI Laboratory, Mitsubishi Electric Corporation
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KINOMURA Atsushi
Osaka National Research Institute, AIST
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HORINO Yuji
Osaka National Research Institute, AIST
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FUJII Kanenaga
Osaka National Research Institute, AIST
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HORINO Yuji
National Institute of Advanced Industrial Science and Technology
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KINOMURA Atsushi
National Institute of Advanced Industrial Science and Technology
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MORI Natsuki
Department of Electrical Engineering, Oyama National College of Technology
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FREY Lothar
Fraunhofer Institut fuer Integrierte Schaltungen
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RYSSEL Heiner
Fraunhofer Institut fuer Integrierte Schaltungen
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Horiba Yasutaka
System Lsi Laboratory Mitsubishi Electric Corporation
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Nishimura Tadashi
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Awaji Naoki
Sortec Corporation:(present Address)fujitsu Laboratories Ltd.
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Ogawa Izumi
Department Of Physics Osaka University
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Mori Natsuki
Department Of Electrical Engineering Oyama National College Of Technology
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Arita Y
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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Ryssel Heiner
The Fraunhofer Institut Fur Integrierte Schaltungen Bauelementetechologie
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Sayama H
Mitsubishi Electric Corp. Hyogo Jpn
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KODAIRA Masanobu
SORTED Corporation
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KISHIMOTO Takeshi
SORTED Corporation
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USAMI Hiroshi
SORTED Corporation
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WATANABE Makio
SORTED Corporation
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Usami H
Yamagata Univ. Yonezawa Jpn
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Usami Hiroshi
Hitachi Ltd.
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Horino Yuji
National Inst. Of Advanced Industrial Sci. And Technol. Kansai Osaka Jpn
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Morimoto H
Semiconductor Leading Edge Technologies Inc.
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ARITA Yutaka
Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien
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Takai Mikio
Faculty Of Engineering Science And Research Center For Extreme Materials (rcem) Osaka University
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Kinomura A
National Institute Of Advanced Industrial Science And Technology
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Sonoda K
Ulsi Development Center Mitsubishi Electric Corporation
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Kishimoto Tadafumi
Department Of Physics Osaka University
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Nakamura F
Department Of Orthopaedics Graduate School Of Medical Science Kyoto Prefectural University Of Medici
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Lee L
TRIUMF
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Olin A
TRIUMF
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Yen S
TRIUMF
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INUISHI Masahide
ULSI Laboratory, Mitsubishi Electric Corporation
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FURUKAWA Hiroshi
Department of Surgery, Center for Adult Diseases
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Horino Y
Advanced Device Development Dept. Renesas Technology Corp.
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Okuda S
Mitsubishi Electric Corp. Hyogo Jpn
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Yamanaka Hidetoshi
Department of Urology, Gunma University School of Medicine
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Olin A
Triumf 4004 Wesbrook Mall Vancouver Bc V6t 2a3 Canada
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Kishimoto T
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Ajimura S
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Ejiri H
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Noumi H
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Higashi A
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Inoue G
Department of Physics, Faculty of Science, Osaka University, Toyonaka, Osaka, 560, Japan
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Gill R
TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
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PARK Yang-Keun
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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SAYAMA Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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SAYAMA Hirokazu
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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Hosono Akihiko
Advanced Technology R&d Center Mitsubishi Electric Corporation
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YAMANAKA Hirokazu
Department of Materials Science, Osaka Electro-Communication University
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Natsume Hidetaka
Department of Electrical Engineering, Waseda University
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Mori Natsumi
Department of Electrical Engineering, Oyama National College of Technology
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LEHRER Christoph
Fraunhofer Institut fuer Integrierte Schaltungen
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PARK Yang-Keun
Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien
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NAGAI Takaaki
Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien
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Takagi Yoshihiro
Institute For Molecular Science:(present Address) Himeji Technical University Faculty Of Science
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Yamanaka Hidetoshi
Department Of Materials Science Osaka Electro-communication University
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Nagai Tomonori
Department Of Electronics And Information Science Teikyo University Of Science And Technology
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Nagai T
Department Earth And Space Science Graduate School Of Science Osaka University
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OKUDA Soichiro
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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Ajimura S
Department Of Physics Faculty Of Science Osaka University Toyonaka Osaka 560 Japan
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Higashi A
Department Of Applied Physics Faculty Of Engineering Hokkaido University:(present Address) Division
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Hosono A
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Hosono Akihiko
Faculty Of Engineering Yokohama National University:(present Address) Isuzu Motor Co. Ltd.
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Sayama Hirokazu
Ulsi Development Center Mitsubishi Electric Corporation
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Sayama Hirokazu
Faculty Of Engineering Science And Research Center For Extreme Materials Osaka University
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Yamanaka H
Department Of Materials Science Osaka Electro-communication University
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Lipp Stephan
Fraunhofer Institute For Integrated Circuit And Chair For Electronic Devices University Of Erlangen-
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MORIMOTO Hiroji
Research Center for Materials Science at Extreme Conditions, and Faculty of Engineering Science, Osa
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YURA Shinsuke
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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Furukawa Hiroshi
Department Of Plastic And Reconstructive Surgery Graduate School Of Medicine Hokkaido University
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Inuishi Masahide
Advanced Device Development Dept. Renesas Technology Corp.
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Inuishi Masahide
Ulsi Development Center Mitsubishi Electric Corporation
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Hosono Akihiko
Advanced Technology R&d Center Mitsubishi Electric Corp.
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Tagaki Yuji
Information & Communications Research Center Matsushita Electric Industrial Co. Ltd.
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Yura Shinsuke
Advanced Technology R&d Center Mitsubishi Electric Corp.
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Okuda Soichiro
Advanced Technology R&d Center Mitsubishi Electric Corp.
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Nakamura F
Department Of Metal Science And Technology Faculty Of Engineering Kyoto University
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Natsume Hidetaka
Department Of Electrical Engineering Waseda University:(present Address)nec Corporation
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Kishimoto T
Department Of Biotechnology Tottori University
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Furukawa Hiroshi
Department Of Cardiology Okayama Central Hospital
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Furukawa Hiroshi
Department Of Clinical Pathology School Of Health Sciences University Of Occupational And Environmen
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Noumi H
Department Of Physics Faculty Of Science Osaka University Toyonaka Osaka 560 Japan
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Gill R
Triumf 4004 Wesbrook Mall Vancouver Bc V6t 2a3 Canada
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Furukawa Hiroshi
Department Of Applied Chemistry Faculty Of Engineering Nagasaki University
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Ejiri H
Department Of Physics Faculty Of Science Osaka University Toyonaka Osaka 560 Japan
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Takano Yoshinobu
Advanced Technology Research Laboratories, Nippon Steel Corporation
著作論文
- 31a-Y-12 Λ Nucleon Interaction in Nuclei Probed by the quasifree(π^+, K^+) reaction on ^C
- Control of Carrier Collection Efficiency in n+p Diode with Retrograde Well and Epitaxial Layers
- Control of Carrier Collection Efficiency in n^+p Diode with Retrograde Well and Epitaxial Layers
- Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Random Access Memories (DRAMs)
- Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction
- Effect of Y Substitution for Ca in Bi_2Sr_2CaCu_2O_ Superconducting Films Prepared by Liquid Phase Epitaxial Method
- X-ray Photoelectron Spectroscopy Study in Bi_2Sr_2Ca_Nd_xCu_2O_
- Effect of Ni Substitution for Cu in 110 K Phase of (Bi, Pb)-Sr-Ca-Cu-O Superconductors
- Effect of Y Substitution for the Ca Site in the 110 K Phase of (Bi, Pb)-Sr-Ca-Cu-O Superconductors
- Microanalysis of Impurity Contamination in Masklessly Etched Area Using Focused Ion Beam
- Well Structure by High Energy Boron Implantation for Soft Error Reduction in DRAMs
- Single Event Upset in Static Random Access Memories in Atmospheric Neutron Environments
- Experimental Investigation of Thermal Neutron-Induced Single Event Upset in Static Random Access Memories : Semiconductors
- Electron-Beam-Induced Deposition of Pt for Field Emitter Arrays
- Electron Beam Induced Deposition of Pt for Field Emitter Arrays
- Development of Highly Stable Synchrotron Radiation Source at SORTEC : X-Ray Lithography
- Development of Highly Stable Synchrotron Radiation Source at SORTEC