ARITA Yutaka | Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien

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概要

• 同名の論文著者
• Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scienの論文著者

関連著者

• Ogawa Izumi

  Department Of Physics Osaka University

• ARITA Yutaka

  Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien

• Takai Mikio

  Research Center For Environmental Genomics Kobe University

• Kishimoto Tadafumi

  Department Of Physics Osaka University

• TAKAI Mikio

  Research Center for Materials Science at Extreme Conditions, Osaka University

• KISHIMOTO Tadafumi

  Department of Physics,Osaka university

• Takai M

  Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien

• Hatanaka Kichiji

  Research Center For Nuclear Physics Osaka University

• Matsuoka Nobuyuki

  Research Center For Nuclear Physics Osaka University

• Nagai Yasuki

  Research Center For Nuclear Physics Osaka University

• Arita Y

  Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien

• Kishimoto T

  Department Of Physics Osaka University

• Kishimoto T

  Department Of Electrical Engineering Waseda University

• Takai Mikio

  Faculty Of Engineering Science And Reseatch Center For Extreme Materials

• HATANAKA Kichiji

  Research Center for Nuclear Physics, Osaka University

• Ogawa Izumi

  Department of Physics, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan

• Nagai Yasuki

  Research Center for Nuclear Physics, Osaka University, 10-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

• Kishimoto Tadafumi

  Department of Physics, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan

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著作論文

• Evaluation of Fast Neutron Induced Single Event Upset in a Static Random Access Memory and Simulation by Monte Carlo N-Particle Code (MCNPX)
• Single Event Upset in Static Random Access Memories in Atmospheric Neutron Environments
• Experimental Investigation of Thermal Neutron-Induced Single Event Upset in Static Random Access Memories : Semiconductors
• Evaluation of Fast Neutron Induced Single Event Upset in a Static Random Access Memory and Simulation by Monte Carlo N-Particle Code (MCNPX)
• Influence of Elastic Scattering on the Neutron-Induced Single-Event Upsets in a Static Random Access Memory

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