Experimental Investigation of Thermal Neutron-Induced Single Event Upset in Static Random Access Memories : Semiconductors
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概要
- 論文の詳細を見る
- 2001-02-15
著者
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TAKAI Mikio
Research Center for Materials Science at Extreme Conditions, Osaka University
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KISHIMOTO Tadafumi
Department of Physics,Osaka university
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Takai M
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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Ogawa Izumi
Department Of Physics Osaka University
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Arita Y
Research Center For Materials Science At Extreme Conditions And Graduate School Of Engineering Scien
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Kishimoto T
Department Of Physics Osaka University
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Kishimoto T
Department Of Electrical Engineering Waseda University
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ARITA Yutaka
Research Center for Materials Science at Extreme Conditions and Graduate School of Engineering Scien
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Takai Mikio
Research Center For Environmental Genomics Kobe University
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Kishimoto Tadafumi
Department Of Physics Osaka University
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Takai Mikio
Faculty Of Engineering Science And Reseatch Center For Extreme Materials
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