Development of Highly Stable Synchrotron Radiation Source at SORTEC

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X-Ray Reflectometry and Infrared Analysis of Native Oxides on Si (100) Formed by Chemical Treatment
Transient Oxide Layer at a Thermally Grown SiO_2/Si Interface, Interpreted Based on Local Vibration and X-Ray Reflectivity
X-Ray Reflectometry and Infrared Analysis of Native Oxides on Si(100) Formed in Chemical Treatment
31a-Y-12 Λ Nucleon Interaction in Nuclei Probed by the quasifree(π^+, K^+) reaction on ^C
Control of Carrier Collection Efficiency in n+p Diode with Retrograde Well and Epitaxial Layers
Control of Carrier Collection Efficiency in n^+p Diode with Retrograde Well and Epitaxial Layers
Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Random Access Memories (DRAMs)
Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction
Effect of Y Substitution for Ca in Bi_2Sr_2CaCu_2O_ Superconducting Films Prepared by Liquid Phase Epitaxial Method
X-ray Photoelectron Spectroscopy Study in Bi_2Sr_2Ca_Nd_xCu_2O_
Effect of Ni Substitution for Cu in 110 K Phase of (Bi, Pb)-Sr-Ca-Cu-O Superconductors
Effect of Y Substitution for the Ca Site in the 110 K Phase of (Bi, Pb)-Sr-Ca-Cu-O Superconductors
Microanalysis of Impurity Contamination in Masklessly Etched Area Using Focused Ion Beam
Well Structure by High Energy Boron Implantation for Soft Error Reduction in DRAMs
Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8
Detection Limits of Trace Elements for Wavelength Dispersive Total X-Ray Fluorescence under High Flux Synchrotron Radiation
Single Event Upset in Static Random Access Memories in Atmospheric Neutron Environments
Experimental Investigation of Thermal Neutron-Induced Single Event Upset in Static Random Access Memories : Semiconductors
Electron-Beam-Induced Deposition of Pt for Field Emitter Arrays
Electron Beam Induced Deposition of Pt for Field Emitter Arrays
Novel Interface Structures between Ultrathin Oxynitride and Si(001) Studied by X-Ray Diffraction
Densified SiOF Film Formation for Preventing Water Absorption
High-Density Layer at the SiO_2/Si Interface Observed by Difference X-Ray Reflectivity
Densified SiOF Film Formation for Preventing Water Absorption
High-Accuracy X-ray Reflectivity Study of Native Oxide Formed in Chemical Treatment
Improvement of Dose Uniformity in Large Exposure Field for Synchrotron Radiation Lithography
Development of Highly Stable Synchrotron Radiation Source at SORTEC : X-Ray Lithography
Development of Highly Stable Synchrotron Radiation Source at SORTEC
High Speed Multimedia-Multimode TDMA Radio Transmission System for IMT-2000(Special Issue on Third Generation Land Mobile Communication Systems)
Detection Limits of Trace Elements for Wavelength Dispersive Total X-Ray Fluorescence under High Flux Synchrotron Radiation
Novel Interface Structures between Ultrathin Oxynitride and Si(001) Studied by X-Ray Diffraction
Nondestructive Measurement of Hexavalent Chromium in Chromate Conversion Coatings Using X-ray Absorption Near Edge Structure

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