YASUOKA Akihiko | ULSI Laboratory, Mitsubishi Electric Corporation
スポンサーリンク
概要
関連著者
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YASUOKA Akihiko
ULSI Laboratory, Mitsubishi Electric Corporation
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Yasuoka Akihiko
Ulsi Laboratory Mitsubishi Electric Corporation
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INOUE Yasuo
ULSI Development Center, Mitsubishi Electric Corporation
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Inoue Y
National Defense Acad. Yokosuka Jpn
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Inoue Y
Ntt Access Network Service Systems Laboratories Ntt Corporation
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Inoue Yasuo
Ulsi Development Center Mitsubishi Electric Corporation
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YAMAGUCHI Yasuo
Institute for Materials Research, Tohoku University
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Yamaguchi Y
Tohoku Univ. Sendai
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Yamaguchi Y
Kumamoto Techno Res. Park Kumamoto Jpn
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IWAMATSU Toshiaki
ULSI Laboratory, Mitsubishi Electric Corporation
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YAMAGUCHI Yasuo
ULSI Laboratory, Mitsubishi Electric Corporation
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NISHIMURA Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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IPPOSHI Takashi
ULSI Development Center, Mitsubishi Electric Corporation
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YAMADA Michihiro
ULSI Development Center, Mitsubishi Electric Corporation
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MIYOSHI Hirokazu
ULSI Laboratory, Mitsubishi Electric Corporation
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Wada Tomohisa
ULSI Laboratory, Mitsubishi Electric Corporation
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IWAMATSU Toshiaki
Advanced Device Development Dept., Renesas Technology Corp.
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IPPOSHI Takashi
Advanced Device Development Dept., Renesas Technology Corp.
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Yamada M
Mitsubishi Electric Corp. Itami‐shi Jpn
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Yamaguchi Y
Central Workshop Osaka University
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Ipposhi Takashi
Advanced Device Development Dept. Renesas Technology Corp.
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Miyoshi Hirokazu
Ulsi Laboratory Mitsubishi Electric Corporation
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Nishimura Tadashi
The Ulsi Development Center Mitsubishi Electric Corporation
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Nishimura Tadashi
Ulsi Research And Development Center Mitsubishi Electric Corporation
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Iwamatsu Toshiaki
Advanced Device Development Dept. Renesas Technology Corp.
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Wada T
System Lsi Development Center Mitsubishi Electric Corporation
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Wada Tomohisa
Ulsi Laboratory Mitsubishi Electric Corporation
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Ipposhi T
Advanced Device Development Dept. Renesas Technology Corp.
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Miyoshi H
Mitsubishi Electric Corp.
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Miyoshi Hirokazu
徳島大学医学部
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Yamada Michihiro
Ulsi Development Center Mitsubishi Electric Corporation
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Yamada M
Kanazawa Univ. Kanazawa‐shi Jpn
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Nishimura Tadashi
Ulsi Development Center Mitsubishi Electric Corporation
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Kato Takayoshi
Reseach Institute Of Electronics Shizuoka University
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Hirao T
Advanced Device Development Dept. Renesas Technology Corp.
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MAEGAWA Shigeto
ULSI Laboratory, Mitsubishi Electric Corporation
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INUISHI Masahide
ULSI Laboratory, Mitsubishi Electric Corporation
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UEDA Kimio
System LSI Development Center, Mitsubishi Electric Corporation
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MASHIKO Koichiro
System LSI Development Center, Mitsubishi Electric Corporation
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MIYAMOTO Shoichi
ULSI Laboratory, Mitsubishi Electric Corporation
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HIRAO Tadashi
ULSI Laboratory, Mitsubishi Electric Corporation
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FUJINO Takeshi
ULSI Laboratory, Mitsubishi Electric Corporation
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KATO Takaaki
ULSI Laboratory, Mitsubishi Electric Corporation
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INUISHI Masahide
Advanced Device Development Dept., Renesas Technology Corp.
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Ueda K
Mitsubishi Electric Corp. Itami‐shi Jpn
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Ueda Kimio
System Lsi Development Center Mitsubishi Electric Corp.
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Kato T
Graduate School Of Engineering Nagoya University
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Kato Takayoshi
Research Institute Of Electronics Shizuoka University
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Okamoto Y
Nec Corp. Shiga Jpn
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Okamoto Yasuhiro
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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KUROI Takashi
ULSI Development Center, Mitsubishi Electric Corporation
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Maeda H
National Research Inst. Metals Ibaraki
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Maeda H
National Research Institute For Metals Tsukuba Laboratories
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Maegawa Shigeto
Advanced Device Development Dept. Renesas Technology Corp.
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HIRAYAMA Makoto
ULSI Laboratory, Mitsubishi Electric Corporation
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Kato T
Ashikaga Inst. Technol. Tochigi
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Kato T
Optoelectronics Technology Research Lab. Ibaraki
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Ueda K
System Lsi Laboratory Mitsubishi Electric Corporation
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Maegawa Shigeto
Ulsi Development Center Mitsubishi Electric Corporation
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SHIMIZU Satoshi
ULSI Laboratory, Mitsubishi Electric Corporation
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SHIRAHATA Masayoshi
ULSI Development Center, Mitsubishi Electric Corporation
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Miyamoto Shouichi
Ulsi Laboratory Mitsubishi Electric Corporation
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Mashiko Koichiro
The Ulsi Development Center Mitsubishi Electric Corporation
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Mashiko Koichiro
System Lsi Development Center Mitsubishi Electric Corporation
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Mashiko Koichiro
System Lsi Laboratory Mitsubishi Electric Corporation
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Okamoto Yasuyuki
Daioh Electric Corporation
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Okumura Yoshihiro
Research Institute Of Electronics Shizuoka University
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Shinkawata Hiroki
Ulsi Laboratory Mitsubishi Electric Corporation
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OKUMURA Yoshinori
ULSI Laboratory, Mitsubishi Electric Corporation
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Fujino Takeshi
Wood Research Institute, Kyoto University
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Fujino T
Information Technology R&d Center Mitsubishi Electric Corporation:communication Systems R&d
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Fujino T
Wood Research Institute Kyoto University
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Fujino Takeshi
Department Of Electric And Electronic Engineering Ritsumeikan University
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Fujino Takeshi
Ulsi Laboratory Mitsubishi Electric Corporation
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MATSUI Yasuji
ULSI Laboratory, Mitsubishi Electric Corporation
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Ueda K
Ntt Atsugi‐shi Jpn
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Nakao Shuji
Ulsi Laboratory Mitsubishi Electric Corporation
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KOYAMA Hiroshi
ULSI Laboratory, Evaluation amp Analysis Center, Mitsubishi Electric Corporation
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Kuroi T
Ulsi Development Center Mitsubishi Electric Corporation
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Kuroi Takashi
Ulsi Development Center Mitsubishi Electric Corporation
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Ueda Katsuhiko
Department Of Information Engineering Nara National College Of Technology
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Kimura Mikihiro
Ulsi Laboratory Mitsubishi Electric Corporation
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Kondo T
Graduate School Of Science Nagoya University
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MAEDA Hiroshi
ULSI Laboratory, Mitsubishi Electric Corporation
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KIMURA Yoshika
ULSI Laboratory, Mitsubishi Electric Corporation
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HORIBE Hideo
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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IMANAGA Yuji
Ryoden Semiconductor System Engineering
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Kimura Yoshika
Ulsi Laboratory Mitsubishi Electric Corporation
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Okumura Y
Minolta Co. Ltd. Osaka Jpn
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Shimizu Satoshi
Graduate School Tokyo Institute Of Technology
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Kato Takaaki
Ulsi Laboratory Mitsubishi Electric Corporation
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SATO Hirotoshi
ULSI Laboratory, Mitsubishi Electric Corporation
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OHBAYASHI Shigeki
Memory IC Division, Mitsubishi Electric Corporation
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KONDOH Setsu
Memory IC Division, Mitsubishi Electric Corporation
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MATSUO Ryuuichi
Memory IC Division, Mitsubishi Electric Corporation
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Inuishi Masahide
Advanced Device Development Dept. Renesas Technology Corp.
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Inuishi Masahide
Ulsi Development Center Mitsubishi Electric Corporation
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Matsui Yasuji
Ulsi Laboratory Mitsubishi Electric Corporation
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HARAGUCHI Yoshiyuki
ULSI Laboratory, Mitsubishi Electric Corporation
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HIROSE Toshihiko
Memory IC Division, Mitsubishi Electric Corporation
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UKITA Motomu
ULSI Laboratory, Mitsubishi Electric Corporation
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EINO Masanao
Memory IC Division, Mitsubishi Electric Corporation
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SAITO Minoru
Daioh Electric Corporation
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Hirayama Makoto
Ulsi Laboratory Mitsubishi Electric Corporation
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Horibe Hideo
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Eino Masanao
Memory Ic Division Mitsubishi Electric Corporation
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Kondoh Setsu
Memory Ic Division Mitsubishi Electric Corporation
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Ukita Motomu
Ulsi Laboratory Mitsubishi Electric Corporation
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Hirose Toshihiko
Memory Ic Division Mitsubishi Electric Corporation
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Ohbayashi Shigeki
Memory Ic Division Mitsubishi Electric Corporation
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Shirahata M
Ulsi Laboratory Mitsubishi Electric Corporation
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Shirahata Masayoshi
Ulsi Development Center Mitsubishi Electric Corporation
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Haraguchi Yoshiyuki
Ulsi Laboratory Mitsubishi Electric Corporation
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Shimizu Satoshi
Ulsi Laboratory Mitsubishi Electric Corporation
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Sato Hirotoshi
Ulsi Laboratory Mitsubishi Electric Corporation
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Matsuo Ryuuichi
Memory Ic Division Mitsubishi Electric Corporation
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Saito M
Nihon Univ. Tokyo Jpn
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Koyama Hiroshi
Ulsi Development Center Mitsubishi Electric Corporation:(present Address)jeol Limited
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Koyama Hiroshi
Ulsi Laboratory Mitsubishi Electric Corporation
著作論文
- Suppression of Parasitic MOSFETs at LOCOS Edge Region in Partially Depleted SOI MOSFETs
- Analysis of the Delay Distributions of 0.5μm SOI LSIs (Special Issue on SOI Devices and Their Process Technologies)
- Electron Beam Direct Writing Techniques for the Development of Sub-Quarter-Micron Devices
- The Effects on Metal Oxide Semiconductor Field Effect Transistor Properties of Nitrogen Implantation into p^+ Polysilicon Gate
- 111-MHz 1-Mbit CMOS Synchronous Burst SRAM Using a Clock Activation Control Method (Special Issue on ULSI Memory Technology)
- A 4-Mb SRAM Using a New Hierarchical Bit Line Organization Utilizing a T-Shaped Bit Line for a Small Sized Die (Special Issue on ULSI Memory Technology)
- Field Acceleration Model for Time-Dependent Dielectric Breakdown