Field Acceleration Model for Time-Dependent Dielectric Breakdown
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概要
- 論文の詳細を見る
- 1996-08-26
著者
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YASUOKA Akihiko
ULSI Laboratory, Mitsubishi Electric Corporation
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Yasuoka Akihiko
Ulsi Laboratory Mitsubishi Electric Corporation
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KOYAMA Hiroshi
ULSI Laboratory, Evaluation amp Analysis Center, Mitsubishi Electric Corporation
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Kimura Mikihiro
Ulsi Laboratory Mitsubishi Electric Corporation
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Koyama Hiroshi
Ulsi Development Center Mitsubishi Electric Corporation:(present Address)jeol Limited
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Koyama Hiroshi
Ulsi Laboratory Mitsubishi Electric Corporation
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- Circuit Technology for Giga-bit/Low Voltage Operating SOI-DRAM (Special Issue on SOI Devices and Their Process Technologies)
- Field Acceleration Model for Time-Dependent Dielectric Breakdown
- Kikuchi-Band Analysis of X-Ray Photoelectron Diffraction Fine Structure of Si(100) by Precise Angle-Resolved X-Ray Photoelectron Spectroscopy