Light-Intensity Dependence of Photocreated Defects in Hydrogenated Amorphous Silicon-Nitrogen Alloy Films

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概要

• 論文の詳細を見る
• 2003-03-01

著者

• Shimada M

  Ntt Microsystem Integration Lab. Kanagawa Jpn

• Shimada M

  Hiroshima Univ. Higashi‐hiroshima

• SHIMIZU Tatsuo

  Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazawa University

• KUMEDA Minoru

  Department of Electronics, Faculty of Technology, Kanazawa University

• Kimura Susumu

  Graduate School Of Natural Science And Technology Kanazawa University

• Kumeda Minoru

  Department Of Electrical And Computer Engineering Faculty Of Engineering Kanazawa University

• Shimada M

  Graduate School Of Natural Science And Technology Kanazawa University

• Shimada Masaki

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Kanazawa University

• MORIMOTO Akiharu

  Graduate School of Natural Science and Technology, Kanazawa University

• Morimoto Akiharu

  Graduate School Of Natural Science And Technology Kanazawa University

• Kumeda Minoru

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Kanazawa University

• Shimizu Tatsuo

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Kanazawa University

• Shimizu Tatsuo

  Department Of Applied Physics University Of Tokyo

• Kumeda Minoru

  Department of Electric and Electronic Engineering. Kanazawa University

• SHIMADA Masaki

  Department of Animal Sciences, Teikyo University of Science

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