Reduction of Droplet Formatiom by Reducing Target Etching Rate in Pulsed Laser Ablation
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概要
- 論文の詳細を見る
Droplet formation in the film and maximum etching depth of the target in the process of pulsed-laser-ablation (PLA) deposition were investigated by scanning tunneling microscopy and stylus profilometry, respectively. The ratio of the droplet volume to the film volume (V_d/V_f) was found to be proportional to d^3_e (d_e being the maximum etching depth of the target) for a variety of ablated materials and wavelengths of the laser. This fact suggests that a laser with a low fluence, a short wavelength and a short pulse width, and a high-density target are preferred for the preparation of film with fewer droplets.
- 社団法人応用物理学会の論文
- 1994-08-15
著者
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YONEZAWA Yasuto
Industrial Research Institute of Ishikawa (IRII)
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MINAMIKAWA Toshiharu
Industrial Research Institute of Ishikawa (IRII)
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MORIMOTO Akiharu
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazawa University
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SHIMIZU Tatsuo
Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazawa University
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Shimizu Tadao
Department Of Physics University Of Tokyo
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Shimizu T
Department Of Electrical And Electronic Engineering Kanazawa University
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MINAMIKAWA Toshiharu
Department of Electrical and Computer Engineering, Faculry of Engineering, Kanazawa University
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SEGAWA Kazuhito
Industrial Research Institute of Ishikawa
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Shimizu T
Chiba Univ. Chiba Jpn
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Miura T
Environmental Health Sciences Division National Lnstitute For Environmental Studies:(present Address
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Segawa K
Osaka Electro‐communication Univ. Osaka Jpn
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Moto Akihiro
The Authors Are With The Research Center For Superconductor Photonics Osaka University
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Yonezawa Y
Industrial Research Institute Of Ishikawa
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Yonezawa Yasuto
Industrial Research Institute Of Ishikawa
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KATAYAMA Syuji
Department of Electrical and Computer Engineering, Faculty of Technology, Kanazawa Universiry
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Katayama Syuji
Department Of Electrical And Computer Engineering Faculty Of Technology Kanazawa Universiry
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Shimizu Tatsuo
Department Of Applied Physics University Of Tokyo
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Morimoto Akiharu
Department of Electrical and Computer Engineering, Faculty of Engineering,
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