Large-scale test circuits for high-speed and highly accurate evaluation of variability and noise in metal-oxide-semiconductor field-effect transistor electrical characteristics

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Kuroda Rihito

  Graduate School Of Engineering Tohoku University

• KUMAGAI Yuki

  Graduate School of Engineering Tohoku University

• Sugawa Shigetoshi

  Graduate School Of Engineering Tohoku University

• Suwa Tomoyuki

  New Industry Creation Hatchery Center Tohoku University

• Abe Kenichi

  Graduate School Of Engineering Tohoku University

• Fujisawa Takafumi

  Graduate School Of Engineering Tohoku University

• Ohmi Tadahiro

  New Industry Creation Hatchery Center (niche) Tohoku University

• Watabe Shunichi

  Graduate School Of Engineering Tohoku University

• Teramoto Akinobu

  New Industry Creation Hatchery Center (NICHe), Tohoku University, Sendai 980-8579, Japan

• Miyamoto Naoto

  New Industry Creation Hatchery Center, Tohoku University, Sendai 980-8579, Japan

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