The Effect of Organic Compounds Contamination on the Electrical Characteristics of Ultra-Thin Gate Oxide Films

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概要

• 論文の詳細を見る
• 2000-08-28

著者

• 大川 猛

  (独)産業技術総合研究所情報技術研究部門

• NAKAMURA Osamu

  Department of Radiological Technology, Faculty of Health Sciences, Nihon Institute of Medical Scienc

• OHMI Tadahiro

  New Industry Creation Hatchery Center, Tohoku University

• 大川 猛

  東北大学大学院工学研究科

• 大川 猛

  National Institute For Advanced Industrial Science And Technology (aist):information Technology Rese

• Ohkawa Takeshi

  Department Of Electronic Engineering Tohoku University

• SUGAWA Shigetoshi

  Department of Electronic Engineering, Graduate School of Engineering, Tohoku University

• AHARONI Herzl

  New Industry Creation Hatchery Center, Tohoku University

• SUGAWA Sigetoshi

  Tohoku University

• Sugawa Shigetoshi

  Graduate School Of Engineering Tohoku University

• Sugawa Shigetoshi

  Department Of Electronic Engineering Tohoku University

• Ohmi Tadahiro

  New Industry Creation Hatchery Center Future Information Industry Creation Center Tohoku University

• Aharoni Herzl

  New Industry Creation Hatchery Center Tohoku University

• Kobayashi Sadao

  Taisei Corporation

• 大川 猛

  National Institute For Advanced Industrial Science And Technology (aist) Information Technology Rese

• WAKAYAMA Yoshihide

  Department of Electronic Engineering, Tohoku University

• 大川 猛

  (株)トプスシステムズ

• Wakayama Yoshihide

  Department Of Electronic Engineering Tohoku University

• Nakamura Osamu

  Department Of Radiological Technology Faculty Of Health Sciences Nihon Institute Of Medical Science

• Ohmi Tadahiro

  New Industry Creation Hatchery Center (niche) Tohoku University

• Nakamura Osamu

  Department Of Applied Physics Osaka University

• Nakamura Osamu

  Department Of Electronics Engineering Graduate School Of Engineering Tohoku University

• 大川 猛

  宇都宮大学大学院工学研究科情報システム科学専攻

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