H2/N2 Plasma Etching Rate of Carbon Films Deposited by H-Assisted Plasma Chemical Vapor Deposition
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概要
- 論文の詳細を見る
Etching resistance of carbon films deposited by plasma chemical vapor deposition (CVD) is one of the concerns to fabricate nanostructures using such carbon films as protective coating films and dummy films. We have carried out H2/N2 plasma etching of carbon films deposited by using an H-assisted plasma CVD method. The etching rate of carbon films decreases exponentially with increasing the mass density of carbon films from 1.51 to 2.27 g/cm3. The mass density of carbon films is the key parameter to tune the etching resistance.
- 2013-01-25
著者
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Hori Masaru
Department Of Electrical Engineering And Computer Science Graduate School Of Engineering Nagoya Univ
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Shiratani Masaharu
Department Of Electoronics Kyushu University
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Koga Kazunori
Department Of Advanced Energy Engineering Sciences Interdisciplinary Graduate School Of Engineering
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Sekine Makoto
Department Of Electrical Engineering And Computer Science Nagoya University
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Setsuhara Yuichi
Joining And Welding Research Institute Osaka University
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UCHIDA Giichiro
Department of Electric and Electronics Graduate School of Information Science and Electrical Enginee
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Takeda Keigo
Department of Electric Engineering and Computer Science, Nagoya University, Nagoya 464-8603, Japan
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Matsuzaki Hidefumi
Department of Electronics, Kyushu University, Fukuoka 819-0395, Japan
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YAMASHITA Daisuke
Department of Food Science and Technology, Faculty of Agriculture, Kyoto University
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Koga Kazunori
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Urakawa Tatsuya
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Torigoe Ryuhei
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Uchida Giichiro
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Shiratani Masaharu
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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Yamashita Daisuke
Department of Electronics, Graduate School of Information Science and Electrical Engineering, Kyushu University, Fukuoka 819-0395, Japan
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