Metalorganic Vapor Phase Epitaxy of GaAs with AlP Surface Passivation Layer for Improved Metal Oxide Semiconductor Characteristics
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概要
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Growth of an AlP epitaxial layer on the top of GaAs was proposed as a novel in situ passivation method. The AlP layer was almost converted to AlOx upon air exposure, forming a part of a gate dielectric. Removal of AlAs at the GaAs/AlP interface was mandatory for avoiding As-oxide formation upon air exposure, which necessitated complete As removal from the surface when switching growth from GaAs to AlP. H2S treatment allowed us to obtain low-As-content $c(8{\times}2)$ surface reconstruction for the first time with metalorganic vapor phase epitaxy (MOVPE). AlP on the $c(8{\times}2)$ GaAs surface has made it possible to obtain a smooth morphology and complete suppression of arsenic oxide. PL intensity increased by a factor of three with the AlP growth for 10 s at 500 °C, corresponding to a thickness of 0.5 nm. Accumulation capacitance obtained from capacitance–voltage ($C$–$V$) curves was the largest with that growth a condition of AlP, suggesting reduction in interface states.
- 2010-04-25
著者
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Nakano Yoshiaki
Department Of Electrical Engineering And Information Systems The University Of Tokyo
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Terada Yuki
Department Of Agricultural Chemistry Faculty Of Agriculture Meiji University
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Yukihiro Shimogaki
Department of Materials Engineering, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan
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Shimogaki Yukihiro
Department of Electronic Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan
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Masakazu Sugiyama
Department of Electrical Engineering and Information Systems, School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo, Tokyo 113-8656, Japan
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SHIMOGAKI YUKIHIRO
Department of Chemical Engineering, University of Tokyo
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