Effect of Y-Doping on Resistance Degradation of Multilayer Ceramic Capacitors with Ni Electrodes under the Highly Accelerated Life Test

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1997-09-30

著者

• 野村 卓志

  静岡大学電子工学研究所

• Sato A

  Nagaoka Univ. Technol. Niigata Jpn

• Sato Akira

  Optical Technology Division, Minolta Co., Ltd.

• Nakano Yoshiaki

  Research Center For Advanced Science And Technology Univ. Of Tokyo

• Nakano Yoshiaki

  Graduate School Of Engineering The University Of Tokyo

• Sato A

  National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn

• NOMURA Takeshi

  Materials Research Center, TDK Co

• 野村 卓志

  Department Of Advanced Materials Science Faculty Of Engineering Kagawa University

• Nakano Y

  Research Center For Advanced Science And Technology The University Of Tokyo

• SATO Shigeki

  Materials Research Center, TDK Corporation

• NAKANO Yukie

  Materials Research Center, TDK Corporation

• SATO Akira

  Materials Research Center, TDK Corporation

• Sato Shigeki

  Materials Research Center Tdk Corporation

• Sato A

  Takatsuka Laboratory Minolta Co.

• Nomura Takeshi

  Materials Research Center Tdk Corporation

• Nakano Yoshiaki

  Department Of Electrical Engineering And Information Systems The University Of Tokyo

• Nakano Yukie

  Research Center for Advanced Science and Technology, The University of Tokyo

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