Effect of Y-Doping on Resistance Degradation of Multilayer Ceramic Capacitors with Ni Electrodes under the Highly Accelerated Life Test
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-09-30
著者
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野村 卓志
静岡大学電子工学研究所
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Sato A
Nagaoka Univ. Technol. Niigata Jpn
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Sato Akira
Optical Technology Division, Minolta Co., Ltd.
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Nakano Yoshiaki
Research Center For Advanced Science And Technology Univ. Of Tokyo
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Nakano Yoshiaki
Graduate School Of Engineering The University Of Tokyo
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Sato A
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
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NOMURA Takeshi
Materials Research Center, TDK Co
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野村 卓志
Department Of Advanced Materials Science Faculty Of Engineering Kagawa University
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Nakano Y
Research Center For Advanced Science And Technology The University Of Tokyo
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SATO Shigeki
Materials Research Center, TDK Corporation
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NAKANO Yukie
Materials Research Center, TDK Corporation
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SATO Akira
Materials Research Center, TDK Corporation
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Sato Shigeki
Materials Research Center Tdk Corporation
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Sato A
Takatsuka Laboratory Minolta Co.
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Nomura Takeshi
Materials Research Center Tdk Corporation
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Nakano Yoshiaki
Department Of Electrical Engineering And Information Systems The University Of Tokyo
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Nakano Yukie
Research Center for Advanced Science and Technology, The University of Tokyo
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