Sato Akira | Optical Technology Division, Minolta Co., Ltd.
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概要
関連著者
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Sato Akira
Optical Technology Division, Minolta Co., Ltd.
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Sato A
Nagaoka Univ. Technol. Niigata Jpn
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Sato A
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
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Sato A
Takatsuka Laboratory Minolta Co.
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Tominaga Junji
Advanced Optical Memory Group National Institute For Advanced Interdisciplinary Research
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Atoda Nobufumi
Advanced Optical Memory Group National Institute For Advanced Interdisciplinary Research
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Nakano Takashi
Advanced Optical Memory Group, National Institute for Advanced Interdisciplinary Research (NAIR), 1-1-4 Higashi, Tsukuba 305-8562, Japan
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Nakano Takashi
Advanced Optical Memory Group, NAIR, MITI
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TOMINAGA Junji
Advanced Optical Memory Group, National Institute for Advanced Interdisciplinary Research (NAIR)
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NAKANO Takashi
Advanced Optical Memory Group, National Institute for Advenced Interdisciplinary Research (NAIR)
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ATODA Nobufumi
Advanced Optical Memory Group, National Institute for Advanced Interdisciplinary Research (NAIR)
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Fuji H
Sharp Corp. Nara Jpn
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Tominaga J
Center For Applied Near-field Optics Research (can-for) Aist
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Tominaga J
Chikumagawa The 1st Technical Center Tdk
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Atoda Nobufumi
Laboratory For Advanced Optical Technology National Institute Of Advanced Industrial Science And Tec
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Atoda N
Sortec Ibaraki Jpn
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Atoda Nobufumi
Sortec
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Atoda N.
National Institute for Advanced Interdisciplinary Research (NAIR) Advanced Optical Memory Group
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Fuji Hiroshi
AVC Research Laboratory, Sharp Corp.
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Fukaya Toshio
Special Department for COE Projet, National Institute of Materials and Chemical Research
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Atoda N
Laboratory For Advanced Optical Technology National Institute Of Advanced Industrial Science And Tec
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Nakano T
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Fukaya Toshio
Special Department for COE Project, National Institute of Materals and Chemical Research, 1-1 Higashi,
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Sato Akira
Department of Cardiology, Yokosuka Kyosai Hospital
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山口 留美子
秋田大学電気電子工学科
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SATO Susumu
Department of Electrical and Electronic Engineering, Akita University
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野村 卓志
静岡大学電子工学研究所
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YAMAGUCHI Rumiko
Department of Electrical and Electronic Engineering, Akita University
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Sato Akinobu
Functional Devices Research Laboratories Nec Corporation
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Fukaya Toshio
Center For Applied Near-field Optics Research (can-for) National Institute Of Advanced Industrial Sc
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Fukaya Toshio
National Institute Of Materials And Chemical Research
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MATSUI Shinji
Fundamental Res. Labs., NEC Corporation
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Fukaya T.
National Institute for Advanced Interdisciplinary Research (NAIR) Advanced Optical Memory Group
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NAKAJIMA Koji
Laboratory for Brainware Systems, Laboratory for Nanoelectronics and Spintronics, Research Institute
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Nakano Yoshiaki
Research Center For Advanced Science And Technology Univ. Of Tokyo
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Nakano Yoshiaki
Graduate School Of Engineering The University Of Tokyo
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Yamaguchi Rumiko
Department Of Electrical And Electronic Engineering Akita University
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Nakajima Kensuke
Research Institute Of Electrical Communication Tohoku University
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NOMURA Takeshi
Materials Research Center, TDK Co
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BABA Masakazu
Fundamental Research Laboratories, NEC Corporation
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野村 卓志
Department Of Advanced Materials Science Faculty Of Engineering Kagawa University
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Baba M
Institute For Solid State Physics University Of Tokyo
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Nakano Y
Research Center For Advanced Science And Technology The University Of Tokyo
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Baba Masakazu
Fundamental Research Laboratories Nec Corporation
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Baba Masakazu
Ntt Information And Communication Systems Laboratories
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Matsui S
Graduate School Of Science Laboratory Of Advanced Science And Technology For Industry (lasti) Univer
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Katayama Y
Murata Manufacturing Co. Ltd.
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HARADA Tomochika
Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohok
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SATO Atsushi
Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohok
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KINJO Mitsunaga
Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohok
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KATAYAMA Yasuhiro
Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohok
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SATO Shigeo
Laboratory for Electronic Intelligent Systems, Research Institute of Electrical Communication, Tohok
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NAKANO Yukie
Materials Research Center, TDK Corporation
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SATO Akira
Materials Research Center, TDK Corporation
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Sato Susumu
Department Of Electrical And Electronic Engineering Akita University
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Kinjo Mitsunaga
Department Of Electrical And Electronic Engineering Faculty Of Engineering University Of The Ryukyus
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TSUKAMOTO Yuji
Functional Devices Research Laboratories, NEC Corporation
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Tsukamoto Y
Nec Corp. Kanagawa Jpn
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Tsukamoto Yuji
Functional Devices Research Laboratories Nec Corporation
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Harada Tomochika
Laboratory For Electronic Intelligent Systems Research Institute Of Electrical Communication Tohoku
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Nakajima Koji
Laboratory For Brainware Reseach Institute Of Electrical Comunication Tohoku University:laboratory F
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Sato Shigeo
Laboratory For Brainware Systems/nanoelectronics And Spintronics Research Institute Of Electrical Co
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Nomura Takeshi
Materials Research Center Tdk Corporation
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Nakano Yoshiaki
Department Of Electrical Engineering And Information Systems The University Of Tokyo
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Sato Shigeo
Laboratory For Brainware Systems Laboratory For Nanoelectronics And Spintronics Research Institute O
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Sato Akira
Department Of Advanced Surgical Science And Technology Tohoku University
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Kinjo Mitsunaga
Laboratory for Brainware System, Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577 Japan
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Nakano Yukie
Research Center for Advanced Science and Technology, The University of Tokyo
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Sato Shigeo
Laboratory for Brainware System, Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577 Japan
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FUJI Hiroshi
Advanced Technology Research Laboratories, Sharp Corporation
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Fuji Hiroshi
Advanced Technology Research Laboratories Sharp Corporation
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Rajesh Kumar
Department Of Electrical And Electronic Engineering Akita University:(present Address) Department Of
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Matsuo Jiro
Fujitsu Laboratories
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Matsuo Jiro
Fujitsu Laboratories Ltd.
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Karahashi K
Fujitsu Lab. Atsugi
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Karahashi Kazuhiro
Fujitsu Laboratories
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SATO Shigeki
Materials Research Center, TDK Corporation
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KAWANO Naoki
Materials Research Center, TDK Corporation
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YAMAMATSU Junko
Materials Research Center, TDK Corporation
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ARASHI Tomohiro
Materials Research Center, TDK Corporation
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Kawano N
Kyoto Inst. Of Technol. Kyoto Jpn
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Arashi Tomohiro
Materials Research Center Tdk Corporation
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Yamamatsu J
Tdk Co. Narita Jpn
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Yamamatsu Junko
Materials Research Center Tdk Co.
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Sato Shigeki
Materials Research Center Tdk Corporation
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SATO Akira
Fujitsu Laboratories Ltd.
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HIJIYA Shinpei
Fujitsu Laboratories Ltd.
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Kawano Naoki
Materials Research Center Tdk Corporation
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Sato Akira
Department Of Applied Chemistry And Molecular Science Iwate University
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Fuji Hiroshi
Advanced Technology Research Laboratories Sharp Corp.
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Rajesh Kumar
Department of Chemistry, Kakatiya University
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Atoda Nobufumi
Advanced Optical Memory Group, National Institute for Advanced Interdisciplinary
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Fuji Hiroshi
AVC Research Laboratory, Sharp Corp., 2613-1, Ichinomoto-cho, Tenri, Nara 632-8567, Japan
著作論文
- Antimony Aperture Properties on Super-Resolution Near-Field Structure using Different Protection Layers
- The Near-Field Super-Resolution Properties of an Antimony Thin Film
- The Characteristics and the Potential of Super Resolution Near-Field Structure
- New Nonvolatile Analog Memories for Analog Data Processing
- New Nonvolatile Analog Memories for Building Associative Memories
- Effect of Y-Doping on Resistance Degradation of Multilayer Ceramic Capacitors with Ni Electrodes under the Highly Accelerated Life Test
- Aging Behavior of Ni-Electrode Multilayer Ceramic Capacitors with X7R Characteristics
- Patterned Alignment of Liquid Crystal on Photopolymer by Single-Exposure Photocuring Process
- A Novel Alignment Process in Liquid Crystal Cell Fabrication Using Reversible Poly (Vinyl-Cinnamate) Photoalignment Technique
- Study on Chlorine Adsorbed Silicon Surface Using Soft-X-Ray Photoemission Spectroscopy
- Measurement of Sidewall Roughness by Scanning Tunneling Microscope : Inspection and Testing
- Measurement of Sidewall Roughness by Scanning Tunneling Microscope
- Antimony Aperture Properties on Super-Resolution Near-Field Structure using Different Protection Layers