Coupled Monte Carlo-Energy Relaxation Analysis of Hot Carrier Light Emission in Metal Oxide Semiconductor Field Effect Transistor's

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1991-12-30

著者

• YOKOYAMA Seiji

  School of Material Science, Japan Advanced Institute of Science and Technology

• YOKOYAMA Shin

  Research Center for Nanodevices and Systems, Hiroshima University

• Yokoyama Seiji

  School Of Material Science Japan Advanced Institute Of Science And Technology

• Koyanagi Mitsumasa

  Research Center for Integrated Systems, Hiroshima University

• Mori H

  Osaka Univ. Osaka Jpn

• Yokoyama Shin

  Research Center For Integrated Systems Hiroshima University

• Kurino Hiroyuki

  Research Center For Integrated Systems Hiroshima University

• Koyanagi Mitsumasa

  Research Center For Integrated Systems Hiroshima University

• KIBA Hiroyuki

  Research Center for Integrated Systems, Hiroshima University

• MORI Hiroki

  Research Center for Integrated Systems, Hiroshima University

• YAMAGUCHI Ken

  Central Research Laboratory, Hitachi, Lid.

• Kiba Hiroyuki

  Research Center For Integrated Systems Hiroshima University

• Yokoyama S

  Kyushu Univ. Fukuoka Jpn

• Yamaguchi Ken

  Central Research Laboratory Hitachi Ltd.

• Mori Hiroki

  Research Center For Integrated Systems Hiroshima University

• Yamaguchi Ken

  Central Research Laboratory

• Yamaguchi Ken

  Central Research Laboratory Hitachi Lid.

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