Control of Fine Particulate and Gaseous Contaminants by UV/Photoelectron Method (Special Issue on Scientific ULSI Manufacturing Technology)
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概要
- 論文の詳細を見る
Systems for removing particulates and gaseous contaminants using the UV/photoelectron method under atmospheric and low pressure conditions have been investigated and its availability has been demonstrated. From experimental results, more than 90 % of particulate contaminants are removed by this method under atomospheric and low pressure conditions. This method can be used to design superclean spaces for wafer stockers, and wafer delivering systems in the LSI fabrication process.
- 社団法人電子情報通信学会の論文
- 1996-03-25
著者
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Fujii T
Nikon Corporation
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Yokoyama S
Hiroshima Univ. Higashi‐hiroshima Jpn
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Yokoyama S
Communication Res. Lab. Kobe Jpn
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Fujii Toshiaki
Ebara Co. Ltd.
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YOKOYAMA Shin
Research Center for Nanodevices and Systems, Hiroshima University
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HIROSE Masataka
Faculty of Engineering, Hiroshima University
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HIROSE Masataka
Research Center for Integrated Systems, Hiroshima University
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Yokoyama Shin
Research Center For Integrated Systems Hiroshima University
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Okuyama Kikuo
Device Development Center Matsushita Electric Industrial Co. Ltd.
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Seto Takafumi
Faculty Of Engineering Hiroshima University
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Hirose Masataka
Advanced Semiconductor Research Center National Institute Of Advanced Industrial Science And Technol
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OKUYAMA Kikuo
Faculty of Engineering, Hiroshima University
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SUZUKI Hidetomo
Ebara Research Co., Ltd.
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Hirose Masataka
Research Center For Integrated Systems Hiroshima University
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Suzuki Hidetomo
Ebara Research Co. Ltd.
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