Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-07-30
著者
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山田 弘司
核融合科学研究所
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Kobayashi K
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Horiuchi T
東京電機大
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山田 啓文
Department Of Electronic Science And Engineering Kyoto University
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Fujii T
Nikon Corporation
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YAMADA HIROFUMI
Department of Surgery, Saitama Medical Center, Saitama Medical School
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MATSUSHIGE Kazumi
Department of Electronic Science and Engineering, Kyoto University
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KOBAYASHI Kei
International Innovation Center, Kyoto University
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HORIUCHI Toshihisa
Department of Electric Science and Engineering, Graduated School of Kyoto University
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SATOH Nobuo
Department of Electronic Science and Engineering, Kyoto University
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WATANABE Shunji
Nikon Corporation
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FUJII Toru
Nikon Corporation
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