Proposal of a Single Sweep Measurement of a Potential Profile in Tokamak Plasmas by High Voltage Heavy Ion Beam Probes
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概要
- 論文の詳細を見る
Because of the large error induced by the changes of the injection angles of the secondary beam to the analyzer, the measurement of a potential profile in tokamak plasmas by heavy ion beam probe (HIBP) has been performed through tens of successive plasma discharges under the same discharge conditions, at a rate of a few shots to adjust the entrance angles at each point in the plasma. In this paper, a new method for the potential profile measurement by a single poloidal sweep, is proposed, which will automatically eliminate the error induced by the changes in the injection angles. In addition, new results on the calibration of a HIBP in tokamaks, are presented.
- 社団法人プラズマ・核融合学会の論文
- 1993-09-25
著者
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山田 弘司
核融合科学研究所
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IDEI Hiroshi
National Insitute for Fusion Science
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IGUCHI Harukazu
National Institution of Fusion Science, Toki, Gifu 509-5292, Japan
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MATSUOKA Keisuke
National Institute for Fusion Science
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山田 啓文
京都大学工学研究科電子工学専攻
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Iguchi H
National Institute For Fusion Science
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Iguchi Harukazu
National Institute For Fusion Science
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MASAI Kuniaki
National Institute for Fusion Science
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Fujisawa A
National Institute For Fusion Science
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Fujisawa Akihide
National Institute For Fusion Science
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Hamada Y
Nagoya Municipal Industrial Res. Inst. Nagoya Jpn
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HAMADA Yasuji
National Institute for Fusion Science
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Kawasumi Yoshiaki
National Institute for Fusion Science
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JIPP T-IIU
National Institute for Fusion Science
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Idei Hiroshi
Kyushu Univ. Fukuoka Jpn
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Matsuoka K
National Institute for Fusion Science
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福山 淳
Department Of Nuclear Engineering Kyoto University
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Fukuyama Atsushi
School Of Engineering Okayama University
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Masai K
National Institute For Fusion Science
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Kawasumi Y
National Institute For Fusion Science
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Fukuyama A
National Institute For Fusion Science
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浜田 泰司
National Institute for Fusion Science
関連論文
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