Wiener-Hopf Solutions to Electromagnetic Wave Scattering by a Finite Conducting Thin Plate in Case of a Line Source
スポンサーリンク
概要
- 論文の詳細を見る
- 1997-11-05
著者
-
Fukuma T
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
-
Fujii T
Japan Telecom Co. Ltd. Tokyo Jpn
-
Fujii T
Nikon Corporation
-
FUJII Toru
Nikon Corporation
-
MAEDA Hiroshi
Faculty of Pharmaceutical Sciences, Okayama University
-
IMAI Tetsuro
NTT Mobile Communications Network Inc.
-
FUJII Teruya
NTT Mobile Communications Network Inc.
-
HATA Masaharu
NTT Mobile Communications Network Inc.
-
HATA Masaharu
The authors are with NTT Mobile Communications Network Inc.
-
UCHIDA Kazunori
Faculty of Information Engineering, Fukuoka Inst. of Tech.
-
Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
-
Imai T
The Authors Are With Ntt Mobile Communications Network Inc.
-
Hata M
Ntt Mobile Communications Network Inc. Tokyo Jpn
-
MAEDA Hiroshi
Production Engineering Research Laboratory, Matsushita Electric Works, Ltd.
-
Maeda H
Fukuoka Inst. Of Technol. Fukuoka‐shi Jpn
-
Fujii T
Department Of Electronic Science And Engineering Kyoto University
-
Uchida Kazunori
Faculty Of Engineering Fukuoka Institute Of Technology
-
Maeda Hiroshi
Faculty Of Pharmaceutical Sciences Okayama University:kumamoto University Medical School
-
Uchida Ken
Corporate R&d Center Toshiba Corporation
-
Maeda Hiroshi
Faculty Of Engineering Kyushu Institute Of Technology
関連論文
- Generation of drug-resistant mutants of Helicobacter pylori in the presence of peroxynitrite, a derivative of nitric oxide, at pathophysiological concentration
- Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy
- Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy
- Submolecular-Resolution Studies on Metal-Phthalocyanines by Noncontact Atomic Force Microscopy
- Investigations of Nanoparticles by Scanning Near-Field Optical Microscopy Combined with Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever
- Noncontact Atomic Force Microscopy Investigation of Phase-Separated Alkanethiol Self-Assembled Monolayers with Different Head Groups
- Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy