Fujii T | Department Of Electronic Science And Engineering Kyoto University
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概要
関連著者
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Fukuma T
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Fujii T
Japan Telecom Co. Ltd. Tokyo Jpn
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FUJII Toru
Nikon Corporation
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Fujii T
Department Of Electronic Science And Engineering Kyoto University
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Fujii T
Nikon Corporation
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山田 弘司
核融合科学研究所
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松重 和美
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Kobayashi K
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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山田 啓文
Department Of Electronic Science And Engineering Kyoto University
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Hamada Y
Nagoya Municipal Industrial Res. Inst. Nagoya Jpn
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YAMADA HIROFUMI
Department of Surgery, Saitama Medical Center, Saitama Medical School
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MATSUSHIGE Kazumi
Department of Electronic Science and Engineering, Kyoto University
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HAMADA Yasuji
National Institute for Fusion Science
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Yamada H
Department Of Electronics Nagoya University
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Kobayashi K
Kobe Steel Ltd. Kobe Jpn
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松重 和美
京都大学工学研究科電子物性工学専攻
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Kishio Kohji
Department Of Applied Chemistry University Of Tokyo:sorst Japan Science And Technology Corporation (
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Kamigaki K
College Of Liberal Arts Toyama University
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Kudoh Kazuhide
Department Of Applied Physics Tokyo University Of Science
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Matsushige Kazumi
Department Of Applied Science Faculty Of Engineering Kyushu University
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Yamada Hirofumi
Department Of Electronics Science And Engineering Kyoto University
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山田 弘司
自然科学研究機構 核融合科学研究所 ヘリカル研究部
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FUKUMA Takeshi
Department of Electronic Science and Engineering, Kyoto University
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Fukuma Takeshi
Department Of Electronic Science And Engineering Kyoto University
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Yamada Hirofumi
Department of Electrical Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8510, Japan
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山田 啓文
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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松重 和美
京都大学大学院工学研究科
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山田 啓文
京都大学工学研究科電子工学専攻
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Kinoshita K
Ntt Basic Research Laboratory
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KOBAYASHI Kei
International Innovation Center, Kyoto University
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Kinoshita K
Ntt Basic Research Laboratories
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Kunihiro Kazuaki
Optoelectronics And High Frequency Device Research Laboratories Nec Corporation
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Kitazawa Koichi
Ntt Basic Research Laboratories
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Kurihara K
Ntt Basic Research Laboratories
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HATA Masaharu
The authors are with NTT Mobile Communications Network Inc.
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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Kobayashi Keiji
Toshiba Research And Development Center
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Imai T
The Authors Are With Ntt Mobile Communications Network Inc.
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Hata M
Ntt Mobile Communications Network Inc. Tokyo Jpn
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山田 弘司
Department Of Electronic Science And Engineering Kyoto University
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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YAMAMOTO Tsuyoshi
Fujitsu Laboratories Ltd.
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松重 和美
京大工
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Ishida Toru
Materials And Components Research Laboratory Matsushita Electric Industrial Co. Ltd.
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Yamada M
Mitsubishi Electric Corp. Itami‐shi Jpn
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Yamada Minoru
Faculty of Health Sciences, Kobe University School of Medicine
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Ishikawa Tsutomu
Fujitsu Laboratories Lid.
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Ishikawa Toshihiro
The Telecom Research Lab. Matsushita Communication Ind. Co. Ltd.
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Ishida T
Osaka Prefecture Univ. Sakai‐shi Jpn
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HIGASHI Toshio
Fujitsu Laboratories Lid.
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FUJII Takuya
Fujitsu Laboratories Lid.
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SODA Haruhisa
Fujitsu Laboratories Lid.
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IMAI Tetsuro
NTT Mobile Communications Network Inc.
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FUJII Teruya
NTT Mobile Communications Network Inc.
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HATA Masaharu
NTT Mobile Communications Network Inc.
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Ishikawa T
Microwave Device Development Department Mitsubishi Electric Corporation
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MAEDA Hiroshi
Production Engineering Research Laboratory, Matsushita Electric Works, Ltd.
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Maeda H
Fukuoka Inst. Of Technol. Fukuoka‐shi Jpn
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Soda H
Fujitsu Laboratories Lid.
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Yamamoto T
Graduate School Of Information Science And Technology Hokkaido University
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Yamada M
Kanazawa Univ. Kanazawa‐shi Jpn
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Yamada Minoru
Faculty Of Engineering Kanazawa University
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堀内 敏行
東京電機大学工学部
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一井 崇
Department Of Materials Science And Engineering Kyoto University
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Ichii T
Department Of Electronic Science And Engineering Kyoto University
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Horiuchi T
東京電機大
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Ichii Takashi
Department Of Electronic Science And Engineering Kyoto University
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KOBAYASHI Kei
Innovative Collaboration Center, Kyoto University
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HIRATA Yoshiki
National Institute of Advanced Industrial Science and Technology
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KAJITA Teruyuki
Department of Electronic Science and Engineering, Kyoto University
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URABE Masashi
Venture Business Laboratory, Kyoto University
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HORIUCHI Toshihisa
Department of Electric Science and Engineering, Graduated School of Kyoto University
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SATOH Nobuo
Department of Electronic Science and Engineering, Kyoto University
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WATANABE Shunji
Nikon Corporation
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UMEDA Keiichi
Department of Electronic Science and Engineering, Kyoto University
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KOBAYASHI Kei
Department of Eletronic Science and Engineering Kyoto university
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Kobayashi Kei
Department Of Biotechnology And Life Sciences Tokyo University Of Agriculture And Technology
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MAEDA Hiroshi
Faculty of Pharmaceutical Sciences, Okayama University
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Watanabe Souichi
The Niigata Institute Of Technology
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UCHIDA Kazunori
The Faculty of Information Engineering at Fukuoka Institute of Technology
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MAEDA Hiroshi
The Faculty of Information Engineering at Fukuoka Institute of Technology
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UCHIDA Kazunori
The author is with the Faculty of Information Engineering at Fukuoka Institute of Technology
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IMAI Tetsuro
The authors are with NTT Mobile Communications Network Inc.
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FUJII Teruya
The authors are with NTT Mobile Communications Network Inc.
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UCHIDA Kazunori
Faculty of Information Engineering, Fukuoka Inst. of Tech.
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Satoh Nobuo
Department Of Electronic Science And Engineering Kyoto University
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Urabe Masashi
Venture Business Laboratory Kyoto University
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Umeda K
Department Of Electronic Science And Engineering Kyoto University
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Hirata Yoshiki
Institute For Biological Resources And Functions National Institute Of Advanced Industrial Science A
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Horiuchi Toshihisa
Department Of Applied Physics Faculty Of Engineering Kyushu University
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Watanabe S
Fujitsu Lab. Ltd. Kawasaki‐shi Jpn
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Kajita Teruyuki
Department Of Electronic Science And Engineering Kyoto University
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Tokuhisa Hiroaki
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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Kobayashi Kei
Department Of Applied Chemistry Faculty Of Engineering Chiba University
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Uchida Kazunori
The Faculty Of Engineering At Fukuoka Institute Of Technology
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Uchida Kazunori
Faculty Of Engineering Fukuoka Institute Of Technology
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Maeda Hiroshi
Faculty Of Pharmaceutical Sciences Okayama University:kumamoto University Medical School
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Maeda Hiroshi
The Faculty Of Engineering Kyushu University
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Ichii Takashi
Department Of Materials Science And Engineering Kyoto University
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Maeda Hiroshi
Faculty Of Engineering Kyushu Institute Of Technology
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Ichii Takashi
Department of Materials Science and Engineering, Kyoto University, Yoshida-hommachi, Sakyo-ku, Kyoto 606-8501, Japan
著作論文
- Molecular resolution imaging of protein molecules in liquid using frequency modulation atomic force microscopy
- Self-Assembled Monolayers of Alkanethiol and Fluoroalkanethiol Investigated by Noncontact Atomic Force Microscopy
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Temperature Dependence of Gain Characteristics in 1.3-μm AlGaInAs/InP Strained Multiple-Quantum-Well Semiconductor Lasers (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- Temperature Dependence of Gain Characteristics in 1.3-μm AlGaInAs/InP Strained Multiple-Quantum-Well Semiconductor Lasers (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
- Analysis of Electromagnetic Wave Scattering by a Conducting Thin Plate and Image Coefficient for Ray Tracing Method
- Analysis of Plane Wave Scattering by a Conducting Thin Plate and a Criterion for Ray Tracing Method
- Wiener-Hopf Solutions to Electromagnetic Wave Scattering by a Finite Conducting Thin Plate in Case of a Line Source