Uchida K | Advanced Lsi Technology Laboratory Toshiba Corporation

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Unified Roughness Scattering Model Incorporating Scattering Component Induced by Thickness Fluctuation in SOI MOSFETs
Analytical Single-Electron Transistor(SET)Model for Design and Analysis of Realistic SET Circuits
The effect of side-traps on ballistic transistor in Kondo regime
Random Number Generator with 0.3MHz Generation Rate using Non-Stoichiometric Si_xN MOSFET
Non-Volatile Doubly Stacked Si Dot Memory with Si Nano-Crystalline Layer
Analysis of Electromagnetic Wave Scattering by a Conducting Thin Plate and Image Coefficient for Ray Tracing Method
Analysis of Plane Wave Scattering by a Conducting Thin Plate and a Criterion for Ray Tracing Method
Wiener-Hopf Solutions to Electromagnetic Wave Scattering by a Finite Conducting Thin Plate in Case of a Line Source
Novel Si Quantum Memory Structure with Self-Aligned Stacked Nanocrystalline Dots
Experimental Analysis of Carrier Charging Characteristics in Si Nanocrystal Floating Gate Memory
Power Consumption of Hybrid Circuits of Single-Electron Transistors and Complementary Metal-Oxide-Semiconductor Field-Effect Transistors
SET/CMOS Hybrid for Future Low-Power LSI : Experimental Demonstration, Power Estimation, and Strategy for Its Reduction
A Numerical Simulation of Low-Grazing-Angle Scattering from Ocean-Like Dielectric Surfaces
Ray Tracing Analysis of Large-Scale Random Rough Surface Scattering and Delay Spread
FVTD Simulation for Random Rough Dielectric Surface Scattering at Low Grazing Angle(Special Issue on Problems of Random Scattering and Electromagnetic Wave Sensing)
Rough Surface and Delay Spread
A New Design Scheme for Logic Circuits with Single Electron Transistors

もっと見る

スポンサーリンク